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Patent Searching and Data


Title:
RADIO FREQUENCY IDENTIFICATION BASED THREE-DIMENSIONAL METROLOGY
Document Type and Number:
WIPO Patent Application WO/2023/098444
Kind Code:
A1
Abstract:
A method for obtaining three-dimension measurements for an object utilizing a population of radio-frequency identification (RFID) chips in a medium includes placing the object into a container with the population of RFID chips in the medium. The method also includes capturing a plurality of coordinates for the population of RFID chips in the medium, where a set of coordinates from the plurality of coordinates correspond to each RFID chip from the population of RFID chips. The method includes plotting the plurality of coordinates for the population of RFID chips in the medium, wherein a plot of the plurality of coordinates provides a three-dimensional image of the object.

Inventors:
AKINLEMIBOLA OLAWUNMI (US)
BENNETT JENNIFER I (US)
LEWIS THERON LEE (US)
Application Number:
PCT/CN2022/131070
Publication Date:
June 08, 2023
Filing Date:
November 10, 2022
Export Citation:
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Assignee:
IBM (US)
IBM CHINA CO LTD (CN)
International Classes:
H05K13/08; G01C15/00; G06T17/00
Foreign References:
US20200329228A12020-10-15
US20190346268A12019-11-14
US20100097184A12010-04-22
US20100256790A12010-10-07
CN106132545A2016-11-16
US20160073081A12016-03-10
US20090082964A12009-03-26
CN113474791A2021-10-01
JP2006270456A2006-10-05
Attorney, Agent or Firm:
ZHONGZI LAW OFFICE (CN)
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