REFLECTIVE FPM USING PARABOLIC MIRROR

WIPO Patent Application WO/2021/167186

A1

The present invention relates to a reflective FPM using a parabolic mirror and, more specifically, to a reflective FPM using a parabolic mirror, the reflective FPM comprising: a first illuminator having a first panel configured as a first LED array which is provided with a plurality of LED light sources and sequentially irradiates, at different angles via transmission through an object lens, a plurality of first LED beams onto an object for measurement; a second illuminator having a second panel configured as a second LED array which is provided with a plurality of LED light sources and sequentially irradiates, at different angles, a plurality of second LED beams onto the object for measurement after the irradiation by the first illuminator; a parabolic mirror which reflects the second beams generated by the second illuminator to be incident onto the object for measurement; a lens configured to collect beams from the object for measurement, which have been irradiated by the first or second LED beams; and a photodetector which receives light from the lens and acquires images from the plurality of LED beams.

AHN HEE-KYUNG (KR)
LEE HWI-HYEONG (KR)

PCT/KR2020/009568

August 26, 2021

July 21, 2020

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KOREA RES INSTITUTE OF STANDARD AND SCIENCE (KR)

G02B21/36; G02B21/02; G02B21/06

WO2016106379A1

2016-06-30

US10228550B2	2019-03-12
US20150160450A1	2015-06-11
KR20170091089A	2017-08-08

LEE HWIHYEONG, CHON BYONG HYUK, AHN HEE KYUNG: "Reflective Fourier ptychographic microscopy using a parabolic mirror", OPTICS EXPRESS, vol. 27, no. 23, 11 November 2019 (2019-11-11), pages 34382, XP055819429, DOI: 10.1364/OE.27.034382

IPUS PATENT & LAW FIRM (KR)

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