Title:
SAMPLE ANALYSIS CHIP AND FABRICATING METHOD THEREOF
Document Type and Number:
WIPO Patent Application WO/2020/000169
Kind Code:
A1
Abstract:
The present application provides a sample analysis chip. The sample analysis chip includes a base substrate and a working electrode. The working electrode has a double-layer structure. The double-layer structure includes a first electrode layer on the base substrate, and a second electrode layer on a side of the first electrode layer facing away the base substrate. The second electrode layer includes a corrosion-resistant, non-metal conductive material. A material of the first electrode layer and a material of the second electrode layer are different from each other.
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Inventors:
TONG SHUO (CN)
LIU KUN (CN)
LIU KUN (CN)
Application Number:
PCT/CN2018/092795
Publication Date:
January 02, 2020
Filing Date:
June 26, 2018
Export Citation:
Assignee:
BOE TECHNOLOGY GROUP CO LTD (CN)
BEIJING BOE OPTOELECTRONICS TECH CO LTD (CN)
BEIJING BOE OPTOELECTRONICS TECH CO LTD (CN)
International Classes:
G01N27/30
Domestic Patent References:
| WO2013188841A1 | 2013-12-19 |
Foreign References:
| CN204832102U | 2015-12-02 | |||
| US20100159616A1 | 2010-06-24 |
Attorney, Agent or Firm:
TEE & HOWE INTELLECTUAL PROPERTY ATTORNEYS (CN)
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