Title:
SAMPLE MEASUREMENT DEVICE AND SAMPLE MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2021/009987
Kind Code:
A1
Abstract:
This sample measurement device comprises: a sample container for accommodating a sample solution, a light source for emitting emission light onto the sample container from a first direction, an imaging unit for using light scattered by the sample solution to capture an image of the sample solution from a second direction intersecting the first direction, and a calculation unit for calculating the absorbance or density of the sample solution on the basis of the image. On the basis of the image, the calculation unit calculates the degree to which the light amount of the image is attenuated along a fixed optical path length along the first direction and calculates the absorbance or density of the sample solution according to the degree of attenuation.
Inventors:
ADACHI SAKUICHIRO (JP)
ANDO TAKAHIRO (JP)
ANDO TAKAHIRO (JP)
Application Number:
PCT/JP2020/016945
Publication Date:
January 21, 2021
Filing Date:
April 17, 2020
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G01N21/49
Domestic Patent References:
| WO2011138896A1 | 2011-11-10 |
Foreign References:
| JPH0854339A | 1996-02-27 | |||
| JPS6348443A | 1988-03-01 | |||
| JP2012002563A | 2012-01-05 | |||
| JP2011505577A | 2011-02-24 |
Attorney, Agent or Firm:
HIRAKI & ASSOCIATES (JP)
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