Title:
SCANNING OBSERVATION APPARATUS
Document Type and Number:
WIPO Patent Application WO/2018/189836
Kind Code:
A1
Abstract:
With the purpose of acquiring an image with a wider field of view than a single scanner, this scanning observation apparatus (1) includes: light sources (5a, 5b, 5c) that emit illumination light beams; two or more scanners (13a, 13b) that scan the illumination light beams from the light sources; two or more emission units (3a, 3b) that irradiate different locations along the surface of a subject to be observed (A) with the illumination light beams scanned by the scanners; a light detection unit (10) that detects return light beams returning from the subject after being irradiated with the illumination light beams emitted from the emission units, said light detection unit (10) detecting the return light beams by receiving the return light beams by means of a light receiving unit (14) which is disposed in a position different from the emission units that emit the illumination light beams; a timing control unit (12) that controls emission timings so that the illumination light beams are emitted from the emission units non-simultaneously; and an image generation unit (11) that generates an image of the subject on the basis of the intensity of the return light beams detected by the light detection unit and illumination locations of the illumination light beams.
Inventors:
MORI TAKESHI (JP)
NAKAJIMA KEIICHIRO (JP)
NAKAJIMA KEIICHIRO (JP)
Application Number:
PCT/JP2017/015000
Publication Date:
October 18, 2018
Filing Date:
April 12, 2017
Export Citation:
Assignee:
OLYMPUS CORP (JP)
International Classes:
A61B1/00
Domestic Patent References:
| WO2012132750A1 | 2012-10-04 |
Foreign References:
| JP2013106899A | 2013-06-06 |
Attorney, Agent or Firm:
UEDA, Kunio et al. (JP)
Download PDF:
Previous Patent: METHOD FOR MANUFACTURING SEMICONDUCTOR ELEMENT
Next Patent: RIGIDITY VARIABLE DEVICE AND ENDOSCOPE
Next Patent: RIGIDITY VARIABLE DEVICE AND ENDOSCOPE