Title:
SEMICONDUCTOR NANOMATERIAL THERMAL TRANSPORT PROPERTY TEST SYSTEM
Document Type and Number:
WIPO Patent Application WO/2021/227393
Kind Code:
A1
Abstract:
Disclosed is a semiconductor nanomaterial thermal transport property test method, comprising: testing the thermal transport property of a semiconductor material by a semiconductor nanomaterial thermal transport property test device having a wireless communication function to obtain test data; establishing a communication connection with a first semiconductor nanomaterial test center data collection terminal; receiving measurement configuration sent by the first semiconductor nanomaterial test center data collection terminal; receiving a reference signal sent by a second semiconductor nanomaterial test center data collection terminal; determining whether the receiving power of the reference signal is greater than a threshold value; if determining that the receiving power of the reference signal is greater than the threshold value, sending a notification message to the first semiconductor nanomaterial test center data collection terminal; sending an inquiry message to the second semiconductor nanomaterial test center data collection terminal by the first semiconductor nanomaterial test center data collection terminal; and determining, by the second semiconductor nanomaterial test center data collection terminal, whether the sent test data can be received.
Inventors:
BAO BENGANG (CN)
Application Number:
PCT/CN2020/126641
Publication Date:
November 18, 2021
Filing Date:
November 05, 2020
Export Citation:
Assignee:
HUNAN UNIV OF SCI & ENG (CN)
International Classes:
H04L1/00
Foreign References:
| CN111555843A | 2020-08-18 | |||
| CN111027437A | 2020-04-17 | |||
| CN1940111A | 2007-04-04 |
Attorney, Agent or Firm:
BEIJING SHENGFANZHIRONG INTELLECTUAL PROPERTY AGENCY CO., LTD (CN)
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