Title:
SOLID-STATE IMAGING DEVICE AND ELECTRONIC DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/221443
Kind Code:
A1
Abstract:
The present invention pertains to a solid-state imaging device in which it is possible to improve the precision of phase difference detection while suppressing degradation of a captured image, and to an electronic device. Provided is a solid-state imaging device comprising a pixel array unit in which a plurality of pixels are arrayed in a two-dimensional form, the pixel array unit including pixels in which a plurality of photoelectric conversion elements are formed on a single on-chip lens. Some of an inter-pixel separation part and/or an inter-pixel shielding part formed between the pixels juts out in a protruding manner toward the center of the pixels, forming a protruding part. The present art can be applied, e.g., to a CMOS image sensor having pixels for phase difference detection.
Inventors:
SHIRAISHI SHOUICHIROU (JP)
MARUYAMA TAKUYA (JP)
YAGI SHINICHIRO (JP)
SHIMADA SHOHEI (JP)
SATO SHINYA (JP)
MARUYAMA TAKUYA (JP)
YAGI SHINICHIRO (JP)
SHIMADA SHOHEI (JP)
SATO SHINYA (JP)
Application Number:
PCT/JP2018/020309
Publication Date:
December 06, 2018
Filing Date:
May 28, 2018
Export Citation:
Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
International Classes:
H01L27/146; G02B7/34; H04N5/369
Foreign References:
| US20170047363A1 | 2017-02-16 | |||
| JP2007158109A | 2007-06-21 | |||
| JP2017212351A | 2017-11-30 |
Attorney, Agent or Firm:
NISHIKAWA Takashi et al. (JP)
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