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Title:
SPECIMEN INSPECTION DEVICE, OPERATION METHOD OF SPECIMEN INSPECTION APPARATUS, AND OPERATION PROGRAM OF SPECIMEN INSPECTION APPARATUS
Document Type and Number:
WIPO Patent Application WO/2021/014697
Kind Code:
A1
Abstract:
Provided are a specimen inspection apparatus that can proceed with smooth inspection, an operation method of the specimen inspection apparatus, and an operation program of the specimen inspection apparatus. A CPU of the specimen inspection apparatus functions as a determination unit and a display control unit. The determination unit determines whether or not to permit shutdown on the basis of a total number of inspection-possible times that is consumables remaining quantity-related information related to remaining quantity of consumables required for inspection of the specimen. The display control unit performs control of displaying a message based on the result of determination by the determination unit. When the determination unit has determined not to permit shutdown, the display control unit displays a message that the shutdown is not possible.

Inventors:
SETO YOSHIHIRO (JP)
NISHIOKA YUKIE (JP)
TOKIWA NOBUAKI (JP)
ODA AKEMI (JP)
ISHIKAWA SHIGETOSHI (JP)
NAKATSUGAWA HARUYASU (JP)
Application Number:
PCT/JP2020/016058
Publication Date:
January 28, 2021
Filing Date:
April 10, 2020
Export Citation:
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Assignee:
FUJIFILM CORP (JP)
International Classes:
G01N35/00
Foreign References:
JP2013076624A2013-04-25
JP2014089129A2014-05-15
JP2010151672A2010-07-08
JP2013076619A2013-04-25
JP2007303884A2007-11-22
JP2019045446A2019-03-22
Attorney, Agent or Firm:
NAKASHIMA Junko et al. (JP)
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