Title:
SPECIMEN INSPECTION DEVICE, OPERATION METHOD OF SPECIMEN INSPECTION APPARATUS, AND OPERATION PROGRAM OF SPECIMEN INSPECTION APPARATUS
Document Type and Number:
WIPO Patent Application WO/2021/014697
Kind Code:
A1
Abstract:
Provided are a specimen inspection apparatus that can proceed with smooth inspection, an operation method of the specimen inspection apparatus, and an operation program of the specimen inspection apparatus. A CPU of the specimen inspection apparatus functions as a determination unit and a display control unit. The determination unit determines whether or not to permit shutdown on the basis of a total number of inspection-possible times that is consumables remaining quantity-related information related to remaining quantity of consumables required for inspection of the specimen. The display control unit performs control of displaying a message based on the result of determination by the determination unit. When the determination unit has determined not to permit shutdown, the display control unit displays a message that the shutdown is not possible.
Inventors:
SETO YOSHIHIRO (JP)
NISHIOKA YUKIE (JP)
TOKIWA NOBUAKI (JP)
ODA AKEMI (JP)
ISHIKAWA SHIGETOSHI (JP)
NAKATSUGAWA HARUYASU (JP)
NISHIOKA YUKIE (JP)
TOKIWA NOBUAKI (JP)
ODA AKEMI (JP)
ISHIKAWA SHIGETOSHI (JP)
NAKATSUGAWA HARUYASU (JP)
Application Number:
PCT/JP2020/016058
Publication Date:
January 28, 2021
Filing Date:
April 10, 2020
Export Citation:
Assignee:
FUJIFILM CORP (JP)
International Classes:
G01N35/00
Foreign References:
JP2013076624A | 2013-04-25 | |||
JP2014089129A | 2014-05-15 | |||
JP2010151672A | 2010-07-08 | |||
JP2013076619A | 2013-04-25 | |||
JP2007303884A | 2007-11-22 | |||
JP2019045446A | 2019-03-22 |
Attorney, Agent or Firm:
NAKASHIMA Junko et al. (JP)
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