SPECIMEN TRANSPORT DEVICE, SPECIMEN ANALYSIS SYSTEM, AND SPECIMEN PRETREATMENT DEVICE

WIPO Patent Application WO/2022/034711

A1

Provided are a specimen transport device, a specimen analysis system, and a specimen pretreatment device, which have high positional accuracy when stopping a specimen and enable minute positional adjustment when stopping the specimen.　This specimen transport device (1a) comprises: a specimen in which a permanent magnet (10) is installed; a transport path for transporting the specimen with the permanent magnet (10) therebetween; a plurality of coils that are installed on the surface of the transport path on the reverse side from the surface of the transport path on which the specimen is transported; and a drive circuit that applies current to the coils. The drive circuit adjusts the vertical force on the permanent magnet (10) by means of the current applied to a first coil (30B) directly below the position where the permanent magnet (10) is to be stopped, and adjusts the horizontal force on the permanent magnet (10) by means of the current applied to a second coil (30C) adjacent to the first coil, thereby adjusting the stop position of the permanent magnet (10).

AOYAMA YASUAKI (JP)
KANEKO SATORU (JP)
KOBAYASHI HIROYUKI (JP)
TAMAKOSHI TAKESHI (JP)
HOSHI RYOSUKE (JP)
WATANABE HIROSHI (JP)
ONIZAWA KUNIAKI (JP)

PCT/JP2021/011082

February 17, 2022

March 18, 2021

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HITACHI HIGH TECH CORP (JP)

B65G54/02; G01N35/04

WO2020158264A1	2020-08-06
WO2010001873A1	2010-01-07

JP2014532870A	2014-12-08
JPS61127104A	1986-06-14
JP2016534953A	2016-11-10
JP2017227648A	2017-12-28

POLAIRE I.P.C. (JP)

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