Title:
STRESS ANALYSIS DEVICE, STRESS ANALYSIS METHOD AND COMPUTER-READABLE RECORDING MEDIUM
Document Type and Number:
WIPO Patent Application WO/2021/070266
Kind Code:
A1
Abstract:
A stress analysis device 10 is provided with: a stress level estimation unit 11 for estimating a stress level of a user from the biological information of the user; a stress state identification unit 12 for identifying a time period, during which the user is in a predetermined stress state, on the basis of a time-series change of the estimated stress level; and a stress cause association unit 13 for associating the identified time period and information regarding the user.
Inventors:
KITADE TASUKU (JP)
Application Number:
PCT/JP2019/039716
Publication Date:
April 15, 2021
Filing Date:
October 08, 2019
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
A61B5/16
Foreign References:
| JP2019072486A | 2019-05-16 | |||
| JP2018045545A | 2018-03-22 | |||
| JP2019013468A | 2019-01-31 |
Attorney, Agent or Firm:
BRIGHTAS IP ATTORNEYS (JP)
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