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Patent Searching and Data


Title:
SWITCH FAILURE DIAGNOSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/094765
Kind Code:
A1
Abstract:
The present invention is provided with: a first generation unit that generates a first clock; a charge pump that comprises a capacitor, and that generates a voltage to be applied to a control terminal of a switch when an electric charge is transferred to the capacitor on the basis of the first clock generated by the first generation unit; a detection unit that detects the voltage on both ends of the switch; a second generation unit that generates a second clock by dividing the first clock; a quantization unit that quantizes, using the second clock generated by the second generation unit, a detection result obtained by the detection unit; and a determination unit that determines whether or not the value resulting from the quantization by the quantization unit is greater than a prescribed threshold value during the period from when the generation of a voltage by the charge pump has started to when the second clock has gone through N clocks (N is an integer equal to or greater that 2).

Inventors:
SAWANO SHUNICHI (JP)
SUGISAWA YUUKI (JP)
MASE KEISUKE (JP)
Application Number:
PCT/JP2016/085526
Publication Date:
June 08, 2017
Filing Date:
November 30, 2016
Export Citation:
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Assignee:
AUTONETWORKS TECHNOLOGIES LTD (JP)
SUMITOMO WIRING SYSTEMS (JP)
SUMITOMO ELECTRIC INDUSTRIES (JP)
International Classes:
H03K17/00; H02M1/00; H02M3/07; H03K19/00
Foreign References:
JPH04198772A1992-07-20
JPH11127065A1999-05-11
JP2008022152A2008-01-31
JPH0286210A1990-03-27
JPH09148901A1997-06-06
Attorney, Agent or Firm:
KOHNO, Hideto et al. (JP)
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