TEST DESIGN DEVICE, TEST DESIGN METHOD, TEST DESIGN PROGRAM, AND TEST DESIGN SYSTEM

Title:

TEST DESIGN DEVICE, TEST DESIGN METHOD, TEST DESIGN PROGRAM, AND TEST DESIGN SYSTEM

Document Type and Number:

WIPO Patent Application WO/2021/044502

Kind Code:

A1

Abstract:

A node (20) of a test design system extracts, from a block chain to which test cases of a plurality of modules are registered, a test case in which a pseudo module of a first module is set as a connection destination. Further, the node (20) generates a test case in which the connection destination in the extracted test case is replaced with the first module and a program for executing the test case. Further, the node (20) registers the generated test case and program as a contract on the block chain.

Inventors:

KURITA KAORI (JP)
MATSUO KAZUHIRO (JP)

Application Number:

PCT/JP2019/034491

Publication Date:

March 11, 2021

Filing Date:

September 02, 2019

Export Citation:

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Assignee:

NIPPON TELEGRAPH & TELEPHONE (JP)

International Classes:

G06F11/36

Foreign References:

US9934138B1	2018-04-03
CN109446089A	2019-03-08
JP2018194955A	2018-12-06

Attorney, Agent or Firm:

SAKAI INTERNATIONAL PATENT OFFICE (JP)

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