Title:
TEST METHOD, TEST SYSTEM, AND ELEMENT FOR ANTIGEN TESTING
Document Type and Number:
WIPO Patent Application WO/2024/004767
Kind Code:
A1
Abstract:
In this test method, a periodically varying voltage with a periodically reversing polarity is applied at each of the following: between an electrode pair (32A, 33A) of a first test element (3A) that comprises a test specimen (4) of a sample mixed in a solvent and the electrode pair (32A, 33A) positioned so as to sandwich a space (SP1) in which the test specimen (4) is enclosed; and between an electrode pair (32B, 33B) of a second test element (3B) that comprises the test specimen (4) and the electrode pair (32B, 33B) positioned so as to sandwich a space (SP1) in which the test specimen (4) is enclosed. This test method tests for the presence/absence of antigen (40) in a sample by comparing the current flowing in the first test element (3A) due to the applied voltage, with the current flowing in the second test element (3B) due to the applied voltage. The second test element (3B) comprises antibody (38) that is immobilized in a state of exposure to the test specimen (4) and that specifically binds to the antigen (40). The first test element (3A) does not have the antibody (38).
Inventors:
INOUE MASARU (JP)
OYABU NORIAKI (JP)
OYABU NORIAKI (JP)
Application Number:
PCT/JP2023/022816
Publication Date:
January 04, 2024
Filing Date:
June 20, 2023
Export Citation:
Assignee:
TOYO CORP (JP)
International Classes:
G01N27/02
Foreign References:
| JP2007071766A | 2007-03-22 | |||
| JP2008196943A | 2008-08-28 | |||
| JP2000065835A | 2000-03-03 |
Attorney, Agent or Firm:
NII, Hiromori (JP)
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