Title:
TESTING DEVICE, TESTING METHOD, ANALYZING DEVICE, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2007/032194
Kind Code:
A1
Abstract:
A testing device comprises a plurality of testing signal feeding units corresponding to
individual test memories, for feeding the corresponding individual test memories
with testing signals to test the test memories, a plurality of fault detecting
units corresponding to the individual test memories, for detecting the faults
of the test memories, a plurality of first analyzing units corresponding to the
individual test memories, for replacing a faulty memory cell in the corresponding test
memory by any preparatory cell owned by that test memory thereby to determine a
relieving solution to relieve the fault of that test memory, and a second analyzing unit
for succeeding, in response to the start of the analysis of the relief solution on
the different test memories by the first analyzing units, the analyzing operation of
that relief solution from the first analyzing unit not having finished the analysis
of the relief solution, thereby to determine that relief solution.
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Inventors:
KAWASAKI KUNIHIKO (JP)
Application Number:
PCT/JP2006/316638
Publication Date:
March 22, 2007
Filing Date:
August 24, 2006
Export Citation:
Assignee:
ADVANTEST CORP (JP)
KAWASAKI KUNIHIKO (JP)
KAWASAKI KUNIHIKO (JP)
International Classes:
G11C29/44; G01R31/28; G11C29/56
Domestic Patent References:
| WO2002033708A1 | 2002-04-25 |
Foreign References:
| JP2000091388A | 2000-03-31 |
Attorney, Agent or Firm:
RYUKA, Akihiro (22-1 Nishi-Shinjuku 6-chom, Shinjuku-ku Tokyo, JP)
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