Title:
THREE-DIMENSIONAL-SHAPE MEASUREMENT DEVICE, THREE-DIMENSIONAL-SHAPE MEASUREMENT METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2018/163529
Kind Code:
A1
Abstract:
Provided is a control device that acquires, as observation signals for measurement points on an object to be measured, a plurality of observation signals observed using a plurality of projection patterns having different spatial frequencies. The control device, by repeating processing for estimating two component signals included in the observation signals, separates the observation signals into the two component signals and calculates three-dimensional positions of the measurement points on the basis of phases of the separated component signals.
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Inventors:
OHNISHI YASUHIRO (JP)
SHIMIZU TAKASHI (JP)
SHIMIZU TAKASHI (JP)
Application Number:
PCT/JP2017/042486
Publication Date:
September 13, 2018
Filing Date:
November 28, 2017
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01B11/25; G06T7/521
Domestic Patent References:
| WO2016076796A1 | 2016-05-19 |
Foreign References:
| JP2009019941A | 2009-01-29 | |||
| JP2008309551A | 2008-12-25 | |||
| JP2015021862A | 2015-02-02 | |||
| JP2006275529A | 2006-10-12 | |||
| JP2016130663A | 2016-07-21 | |||
| JP2011021970A | 2011-02-03 | |||
| JP2005062063A | 2005-03-10 | |||
| JP2008309551A | 2008-12-25 |
Other References:
GUPTA, MOHITSHREE K. NAYAR: "Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on", 2012, IEEE, article "Micro phase shifting"
See also references of EP 3594617A4
See also references of EP 3594617A4
Attorney, Agent or Firm:
SEKINE, Takehiko et al. (JP)
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