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Title:
THREE-DIMENSIONAL SHAPE MEASUREMENT DEVICE, THREE-DIMENSIONAL SHAPE MEASUREMENT METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2018/163530
Kind Code:
A1
Abstract:
A control device assumes that observation light observed by an imaging device is composite light of primary reflected light, which is light that is projected from a projection device, is reflected at a measurement point on an object to be measured, and enters the imaging device, and secondary reflected light, which is light that is projected from the projection device and reflected off another reflection surface, is reflected at the measurement point on the object to be measured, and enters the imaging device. The control device acquires three or more samples for a luminance amplitude value of the observation light, calculates a phase error caused by the secondary reflected light by using the samples, corrects a phase value of the observation light by using the phase error to calculate a corrected phase value, and calculates a three-dimensional position of the measurement point on the object to be measured on the basis of the corrected phase value.

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Inventors:
HAYASHI KENNOSUKE (JP)
OHNISHI YASUHIRO (JP)
SUWA MASAKI (JP)
Application Number:
PCT/JP2017/042490
Publication Date:
September 13, 2018
Filing Date:
November 28, 2017
Export Citation:
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Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01B11/25; G06T7/521
Domestic Patent References:
WO2016076796A12016-05-19
Foreign References:
JP2009019941A2009-01-29
JP2008309551A2008-12-25
JP2015021862A2015-02-02
JP2006275529A2006-10-12
JP2016130663A2016-07-21
JP2011021970A2011-02-03
JP2005062063A2005-03-10
JP2008309551A2008-12-25
Other References:
GUPTA, MOHITSHREE K. NAYAR: "Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on", 2012, IEEE, article "Micro phase shifting"
See also references of EP 3594618A4
Attorney, Agent or Firm:
SEKINE, Takehiko et al. (JP)
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