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Patent Searching and Data


Title:
TOOL STATE LEARNING DEVICE, TOOL STATE ESTIMATION DEVICE, CONTROL DEVICE, TOOL STATE LEARNING METHOD, AND TOOL STATE ESTIMATION METHOD
Document Type and Number:
WIPO Patent Application WO/2021/200654
Kind Code:
A1
Abstract:
The purpose of the present invention is to easily estimate the tool state from an image of a machined surface. A tool state learning device is provided with: a storage unit for storing an arbitrary image captured by an imaging device imaging a machined surface of an arbitrary workpiece cut using an arbitrary tool; a teacher data acquisition unit for acquiring, as input data, an arbitrary image stored in the storage unit, and acquiring, as a label, the state of the tool annotated according to prescribed levels indicating the degree of wear of the tool on the basis of the arbitrary image; and a tool state learning unit for using the label and the input data acquired by the teacher data acquisition unit to perform supervised learning, and generating a learned model in which a machined surface image of the machined surface of a workpiece imaged by the imaging device is inputted and the state of the tool that cut the machined surface of the workpiece is outputted.

Inventors:
INAGAKI SHOUGO (JP)
OKAJIMA YASUSHI (JP)
SAITOH TAKESHI (JP)
UCHIDA TSUTOMU (JP)
Application Number:
PCT/JP2021/012861
Publication Date:
October 07, 2021
Filing Date:
March 26, 2021
Export Citation:
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Assignee:
FANUC CORP (JP)
HITACHI LTD (JP)
International Classes:
B23Q17/20; B23Q17/09; B23Q17/24; G06N20/00; G06T7/00
Foreign References:
JP2018138327A2018-09-06
JPH0475854A1992-03-10
JP2018181216A2018-11-15
JP2020019087A2020-02-06
JP2019067137A2019-04-25
US20190070682A12019-03-07
JPH11267949A1999-10-05
Attorney, Agent or Firm:
SHOBAYASHI Masayuki et al. (JP)
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