Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
TRANSMISSION ELECTRON MICROSCOPE
Document Type and Number:
WIPO Patent Application WO/1992/005574
Kind Code:
A1
Abstract:
An electron microscope adapted to provide its image on a TV screen. It has been desired to prevent foreign matter from falling on the electron beam luminescent members (3, 8) of a TV camera. To solve this assignment, the electron beam luminescent members are detachably arranged relative to the axis of electron beam between a projection lens system (1) and a fluorescent member (6) for observation.

More Like This:
JPH09265931IMAGE ACQUISITION DEVICE AND ITS METHOD
JPH103876AUTOMATIC SCANNING ANGLE ADJUSTMENT METHOD OF SCANNING ELECTRON MICROSCOPE AND SCANNING ELECTRON MICROSCOPE CAPABLE OF AUTOMATICALLY ADJUSTING SCANNING ANGLE
Inventors:
ISAKOZAWA SHIGETO (JP)
OHASHI TOSHIYUKI (JP)
Application Number:
PCT/JP1988/000482
Publication Date:
April 02, 1992
Filing Date:
May 20, 1988
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
ISAKOZAWA SHIGETO (JP)
OHASHI TOSHIYUKI (JP)
International Classes:
H01J37/22; (IPC1-7): H01J37/22
Foreign References:
JPS6241660U1987-03-12
JPS58189950A1983-11-05
Download PDF:
View/Download PDF      PDF Help



 
Previous Patent: FRIT SEAL FURNACE AND CATHODE RAY TUBE FRAME

Next Patent: FIELD-ASSISTED BONDING