Title:
TURBIDITY MEASUREMENT DEVICE, TURBIDITY MEASUREMENT METHOD, AND TURBIDITY MEASUREMENT PANEL
Document Type and Number:
WIPO Patent Application WO/2021/235533
Kind Code:
A1
Abstract:
A turbidity measurement device 1 that, by means of a reflection region of a measurement mark M1 provided to a turbidity measurement panel 5, improves the sensitivity with which scattered light is detected within a sample S and thereby makes it possible to measure the turbidity of the sample S even under ambient light. By making it easy to measure turbidity even under ambient light, the present invention also eliminates the need for a conventional, e.g., infrared LED, optical system and, to that extent, achieves a simpler configuration.
Inventors:
TAKEUCHI SHOJI (JP)
MORIMOTO YUYA (JP)
HIRATA YUSUKE (JP)
MIYAZAWA TAKESHI (JP)
MORIMOTO YUYA (JP)
HIRATA YUSUKE (JP)
MIYAZAWA TAKESHI (JP)
Application Number:
PCT/JP2021/019261
Publication Date:
November 25, 2021
Filing Date:
May 20, 2021
Export Citation:
Assignee:
UNIV TOKYO (JP)
International Classes:
G01N21/82
Domestic Patent References:
| WO2019139980A1 | 2019-07-18 | |||
| WO2016208415A1 | 2016-12-29 |
Foreign References:
| JP2018004506A | 2018-01-11 |
Attorney, Agent or Firm:
DORAIT IP LAW FIRM (JP)
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