ULTRASONIC INSPECTION APPARATUS AND ULTRASONIC INSPECTION METHOD

WIPO Patent Application WO/2023/058292

A1

Provided is an ultrasonic inspection apparatus in which defect detection performance can be improved, such as by lowering the minimum size of defects that can be detected, and which can carry out detection even in the case of very small defects. In order to solve the aforementioned problem, this ultrasonic inspection apparatus (Z) comprises a scanning measurement device (1) for scanning a body being inspected (E) with an ultrasonic beam (U) and carrying out measurement, and a control device (2) for controlling driving of the scanning measurement device (1). The scanning measurement device (1) is provided with a transmission probe (110) for emitting the ultrasonic beam (U), and a reception probe (121) for receiving the ultrasonic beam (U). The control device (2) is provided with a signal processing unit (250). The signal processing unit (250) is provided with a filter unit (240) for reducing at least a frequency component having the highest intensity within a reception signal of the reception probe (121). The filter unit (240) detects a skirting component other than the highest-intensity frequency component within a fundamental wave band that includes the highest-intensity frequency component.

SUZUKI MUTSUMI (JP)
KOURAI YUUSUKE (JP)
OHNO SHIGERU (JP)

PCT/JP2022/027599

April 13, 2023

July 13, 2022

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HITACHI POWER SOLUTIONS CO LTD (JP)

G01N29/42; G01N29/04; G01N29/24

WO2021039640A1

2021-03-04

JPH07190995A	1995-07-28
JP2018004296A	2018-01-11
JPH06242086A	1994-09-02
JPH0894588A	1996-04-12
JPS61138160A	1986-06-25

ISONO INTERNATIONAL PATENT OFFICE, P.C. (JP)

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