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Title:
VOLTAGE ESTIMATION FOR DETERMINING PERFORMANCE AND DEGRADATION OF AN ELECTROCHROMIC GLASS
Document Type and Number:
WIPO Patent Application WO/2024/006843
Kind Code:
A1
Abstract:
A system for use with a coated glass unit (CGU) may receive an initial set of control parameters associated with a specific CGU. The system may estimate a voltage distribution across the specific CGU based on the initial set of control parameters. The system may determine at least one of an initial performance level (IPL) or an initial degradation level (IDL) of the specific CGU based on the voltage distribution. The system may determine at least one of whether the IPL comprises an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for a specified performance level (SPL). The SPL may include at least one of a specified steady state performance level or a specified transition performance level, or whether the IDL comprises an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for a specified degradation level.

Inventors:
WANG YIGANG (US)
WANG YAN (US)
DI BOLEI (US)
MCGROGAN FRANK (US)
Application Number:
PCT/US2023/069275
Publication Date:
January 04, 2024
Filing Date:
June 28, 2023
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
SAGE ELECTROCHROMICS INC (US)
International Classes:
G09G3/00; G09G3/19
Foreign References:
US20210208468A12021-07-08
US20190221148A12019-07-18
US20190361309A12019-11-28
KR20190027956A2019-03-15
US20180180964A12018-06-28
Attorney, Agent or Firm:
KOWERT, Robert C. (US)
Download PDF:
Claims:
CLAIMS

WHAT IS CLAIMED IS:

1. An electronic device comprising: a memory; and one or more controllers configured to: receive an initial set of control parameters associated with a specific coated glass unit (CGU), wherein the initial set of control parameters comprises at least one an initial voltage or an initial current associated with the specific CGU, estimate a voltage distribution across the specific CGU based on the initial set of control parameters, determine at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution, determine at least one of whether the initial performance level comprises an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for a specified performance level, wherein the specified performance level comprises at least one of a specified steady state performance level or a specified transition performance level, or whether the initial degradation level comprises an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for a specified degradation level, and initiate one or more repair or replacement operations for the specified CGU in response to determining at least one of that the initial performance level comprises the in-pane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level comprises the in-pane uniformity level of the specific CGU that is outside the inpane uniformity level range for the specified degradation level.

2. The electronic device of claim 1 , wherein the one or more controllers are further configured to provide an indication for repair of the specific CGU or replacement of the specific CGU with a new CGU in response to determining at least one of that the initial performance level comprises the in-pane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level comprises the inpane uniformity level of the specific CGU that is outside the in-pane uniformity level range for the specified degradation level.

3. The electronic device of any one of claims 1 or 2, wherein the one or more controllers are further configured to determine a specified set of control parameters for the specific CGU based on at least one of the initial performance level or the initial degradation level and in accordance with at least one of the specified performance level or the specified degradation level for the specific CGU, wherein the specified set of control parameters comprises at least one of a specified voltage for the specific CGU or a specified current for the specific CGU for improving voltage uniformity across the specific CGU.

4. The electronic device of any one of claims 1 or 2, wherein the initial performance level and the specific performance level are associated with average tint levels of the specific CGU.

5. The electronic device of any one of claims 1 or 2, wherein the initial degradation level and the specific degradation level are associated with in-pane uniformity of the specific CGU.

6. The electronic device of any one of claims 1 or 2, wherein the initial set of control parameters associated with the specific CGU comprises at least one of tint holding control parameters or tint transitioning control parameters.

7. The electronic device of any one of claims 1 or 2, wherein the voltage distribution across the specific CGU comprises an edge-to-center stack voltage distribution across the specific CGU.

8. A computer implemented method for assessing coated glass units (CGUs), comprising: receiving an initial set of control parameters associated with a specific CGU, wherein the initial set of control parameters comprises at least one an initial voltage or an initial current associated with the specific CGU; estimating a voltage distribution across the specific CGU based on the initial set of control parameters; determining at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution; determining at least one of whether the initial performance level comprises an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for a specified performance level, wherein the specified performance level comprises at least one of a specified steady state performance level or a specified transition performance level, or whether the initial degradation level comprises an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for a specified degradation level; and initiating one or more repair or replacement operations for the specified CGU in response to determining at least one of that the initial performance level comprises the inpane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level comprises the in-pane uniformity level of the specific CGU that is outside the inpane uniformity level range for the specified degradation level.

9. The method of claim 8, further comprising: providing an indication for repair of the specific CGU or replacement of the specific CGU with a new CGU in response to determining at least one of that the initial performance level comprises the in-pane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level comprises the in-pane uniformity level of the specific CGU that is outside the in-pane uniformity level range for the specified degradation level.

10. The method of any one of claims 8 or 9, further comprising: determining a specified set of control parameters for the specific CGU based on at least one of the initial performance level or the initial degradation level and in accordance with at least one of the specified performance level or the specified degradation level for the specific CGU, wherein the specified set of control parameters comprises at least one of a specified voltage for the specific CGU or a specified current for the specific CGU for improving voltage uniformity across the specific CGU.

11. The method of any one of claims 8 or 9, wherein the initial performance level and the specific performance level are associated with average tint levels of the specific CGU.

12. The method of any one of claims 8 or 9, wherein the initial degradation level and the specific degradation level are associated with in-pane uniformity of the specific CGU.

13. The method of any one of claims 8 or 9, wherein the initial set of control parameters associated with the specific CGU comprises at least one of tint holding control parameters or tint transitioning control parameters.

14. The method of any one of claims 8 or 9, wherein the voltage distribution across the specific CGU comprises an edge-to-center stack voltage distribution across the specific CGU.

15. One or more non-transitory, computer-readable, storage media storing program instructions that when executed on or across one or more processors cause the one or more processors to: receive an initial set of control parameters associated with a specific CGU, wherein the initial set of control parameters comprises at least one an initial voltage or an initial current associated with the specific CGU; estimate a voltage distribution across the specific CGU based on the initial set of control parameters; determine at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution; determine at least one of whether the initial performance level comprises an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for a specified performance level, wherein the specified performance level comprises at least one of a specified steady state performance level or a specified transition performance level, or whether the initial degradation level comprises an m-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for a specified degradation level; initiate one or more repair or replacement operations for the specified CGU in response to determining at least one of that the initial performance level comprises the in-pane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level comprises the in-pane uniformity level of the specific CGU that is outside the inpane uniformity level range for the specified degradation level.

16. The storage media of claim 15, wherein the program instructions when executed on or across the one or more processors further cause the one or more processors to: provide an indication for repair of the specific CGU or replacement of the specific CGU with a new CGU in response to determining at least one of that the initial performance level comprises the in-pane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level comprises the in-pane uniformity level of the specific CGU that is outside the in-pane uniformity level range for the specified degradation level.

17. The storage media of any one of claims 15 or 16, wherein the program instructions when executed on or across the one or more processors further cause the one or more processors to: determine a specified set of control parameters for the specific CGU based on at least one of the initial performance level or the initial degradation level and in accordance with at least one of the specified performance level or the specified degradation level for the specific CGU, wherein the specified set of control parameters comprises at least one of a specified voltage for the specific CGU or a specified current for the specific CGU for improving voltage uniformity across the specific CGU.

18. The storage media of any one of claims 15 or 16, wherein the initial performance level and the specific performance level are associated with average tint levels of the specific CGU.

19. The storage media of any one of claims 15 or 16, wherein the initial degradation level and the specific degradation level are associated with in-pane uniformity of the specific CGU.

20. The storage media of any one of claims 15 or 16, wherein the initial set of control parameters associated with the specific CGU comprises at least one of tint holding control parameters or tint transitioning control parameters.

Description:
VOLTAGE ESTIMATION FOR DETERMINING PERFORMANCE AND DEGRADATION OF AN ELECTROCHROMIC GLASS

FIELD OF THE DISCLOSURE

[0001] The present disclosure is directed to electrochromic devices, and more specifically to various approaches to determine performance and degradation of electrochromic devices by estimating voltage.

BACKGROUND

[0002] An electrochromic device (e.g., one that includes electrically switchable or electrochromic glass) may help to block the transmission of visible light into a building or passenger compartment of a vehicle. Electrochromic devices include electrochromic materials that are known to change their optical properties, such as coloration, in response to the application of an electrical potential, thereby making the device more or less transparent or more or less reflective. For instance, an electrochromic (EC) device can change its optical properties such as optical transmission, absorption, reflectance and/or emittance in a continual but reversible manner on application of voltage. This property enables the EC device to be used for applications like smart glasses, electrochromic mirrors, and electrochromic display devices. Electrochromic glass may include a type of glass or glazing for which light transmission properties of the glass or glazing are altered when electrical power (e.g., voltage/current) is applied to the glass. Electrochromic materials may change in opacity (e.g., may changes levels of tinting) when electrical power is applied.

[0003] Typical electrochromic (“EC”) devices generally include a counter electrode layer (“CE layer”), an electrochromic material layer (“EC layer”) which is deposited substantially parallel to the counter electrode layer, and an ionically conductive layer (“IC layer) separating the counter electrode layer from the electrochromic layer, respectively. In addition, two transparent conductive (TC) layers (e.g., two transparent conductive oxide layers) respectively may be substantially parallel to and in contact with the CE layer and the EC layer. The EC layer, IC layer, and CE layer can be referred to collectively as an EC stack, EC thin film stack, etc.

[0004] When an electric potential is applied across the layered structure of the electrochromic device, such as by connecting the respective TC, or TCO, layers to a low voltage electrical source, ions, which can include Li+ ions stored in the CE layer, flow from the CE layer, through the IC layer and to the EC layer. In addition, electrons flow from the CE layer, around an external circuit including a low voltage electrical source, to the EC layer so as to maintain charge neutrality in the CE layer and the EC layer. The transfer of ions and electrons to the EC layer causes the optical characteristics of the EC layer, and optionally the CE layer in a complementary EC device, to change, thereby changing the coloration and, thus, the transparency of the electrochromic device. [0005] In some aspects, optical performance (e.g., pane-to-pane matching, in-pane uniformity) may be critical for customer experience. However, in the field, no optical sensor may be installed to monitor optical performance of electrochromic glass.

SUMMARY

[0006] In some aspects, optical performance (pane-to-pane matching, in-pane uniformity) may be critical for customer experience. In the field, no optical sensor may be installed to monitor optical performance of electrochromic glass. It may be important for a controller to estimate inpane uniformity and IGU average tint level during transition and holding, without using optical sensors. For example, a controller may provide a pane-to-pane assessment to match performance, an assessment of in-pane uniformity, and/or an assessment of IGU health status for triggered protective control strategy to prevent further degrade IGU, and to notify a maintenance team for further diagnostics or replacement. The controller may thus improve control accuracy using inpane uniformity estimation and provide edge-to-center stack voltage estimation using voltage and current.

BRIEF DESCRIPTION OF THE DRAWINGS

[0007] FIG. 1 illustrates an example electrochromic (EC) device according to some aspects.

[0008] FIG. 2 illustrates an example environment including a computer system that may be used for generating a coated glass unit (CGU) configuration model according to some aspects.

[0009] FIG. 3 illustrates an example environment including a computer system that may be used for implementing a CGU configuration model according to some aspects.

[0010] FIG. 4 illustrates an example diagram conceptualizing a relationship between CGU performance and reliability according to some aspects.

[0011] FIG. 5 illustrates an example method for tuning a CGU according to some aspects.

[0012] FIG. 6 illustrates an example method for tuning a CGU according to some aspects.

[0013] FIG. 7 illustrates an example method for tuning a CGU according to some aspects.

[0014] FIG. 8 illustrates an example method for tuning a CGU according to some aspects.

[0015] FIG. 9 illustrates an example method for tuning a CGU according to some aspects.

[0016] FIG. 10 illustrates an example method for tuning a CGU according to some aspects.

[0017] FIG. 11 illustrates an example method for tuning a CGU according to some aspects.

[0018] FIG. 12 illustrates an example method for tuning a CGU according to some aspects.

[0019] FIG. 13 illustrates an example method for estimating optical performance of a CGU according to some aspects. [0020] FIG. 14 illustrates an example method for estimating optical performance of a CGU according to some aspects.

[0021] FIG. 15 illustrates an example method for estimating optical performance of a CGU according to some aspects.

[0022] FIG. 16 is a block diagram illustrating a computer system according to some aspects.

[0023] While embodiments are described herein by way of example for several embodiments and illustrative drawings, those skilled in the art will recognize that the embodiments are not limited to the embodiments or drawings described. It should be understood that the drawings and detailed description thereto are not intended to limit embodiments to the particular form disclosed, but on the contrary, the intention is to cover all modifications, equivalents and alternatives falling within the spirit and scope as defined by the appended claims. The headings used herein are for organizational purposes only and are not meant to be used to limit the scope of the description or the claims. As used throughout this application, the word "may" is used in a permissive sense (i.e., meaning having the potential to), rather than the mandatory sense (i.e., meaning must). The words “include,” “including,” and “includes” indicate open-ended relationships and therefore mean including, but not limited to. Similarly, the words “have,” “having,” and “has” also indicate open- ended relationships, and thus mean having, but not limited to. The terms “first,” “second,” “third,” and so forth as used herein are used as labels for nouns that they precede, and do not imply any type of ordering (e.g., spatial, temporal, logical, etc.) unless such an ordering is otherwise explicitly indicated.

[0024] “Based On. ” As used herein, this term is used to describe one or more factors that affect a determination. This term does not foreclose additional factors that may affect a determination. That is, a determination may be solely based on those factors or based, at least in part, on those factors. Consider the phrase “determine A based on B.” While B may be a factor that affects the determination of A, such a phrase does not foreclose the determination of A from also being based on C. In other instances, A may be determined based solely on B.

[0025] The scope of the present disclosure includes any feature or combination of features disclosed herein (either explicitly or implicitly), or any generalization thereof, whether or not it mitigates any or all of the problems addressed herein. Accordingly, new claims may be formulated during prosecution of this application (or an application claiming priority thereto) to any such combination of features. In particular, with reference to the appended claims, features from dependent claims may be combined with those of the independent claims and features from respective independent claims may be combined in any appropriate manner and not merely in the specific combinations enumerated in the appended claims. DETAILED DESCRIPTION

[0026] When an electric potential is applied across the layered structure of the electrochromic device, such as by connecting the respective TC, or TCO, layers to a low voltage electrical source, ions, which can include Li+ ions stored in the CE layer, flow from the CE layer, through the IC layer and to the EC layer. In addition, electrons flow from the CE layer, around an external circuit including a low voltage electrical source, to the EC layer so as to maintain charge neutrality' in the CE layer and the EC layer. The transfer of ions and electrons to the EC layer causes the optical characteristics of the EC layer, and optionally the CE layer in a complementary EC device, to change, thereby changing the coloration and, thus, the transparency of the electrochromic device. [0027] Many electrochemical devices use specific redox reactions that occur within a set range of applied voltage(s). In many cases, irreversible side reactions or other unwanted mechanisms may be activated in voltage ranges that overlap with the desired redox reactions. To increase a lifetime of an electrochemical device, a “safe” voltage range may be identified for that particular electrochemical device and operating voltage limits may be maintain accordingly. In the case of electrochromic devices, electronic leakage may be an important degradation variable. Excessive leakage in electrochromic devices may cause individual devices or entire facades to exhibit abnormal levels of transparency or to appear non-uniform. Prolonged or repeated exposure to high voltage may cause leakage to increase over long time scales. This leakage degradation process leads to a gradual deterioration of product appearance and controllability, and must be avoided to maximize lifetime of electrochromic devices. A controller may control stack voltage on the electrochemical or electrochromic stack to ensure that a degradation threshold is not exceeded. Previous designs of electrochromic device controls may be focused on optimizing appearance in the short term, and may not account for leakage accumulation in the films caused by excessive voltage. Modest decrease of target stack voltage may still maintain desirable appearance, while mitigating risk of leakage degradation.

[0028] In some aspects, the leakage degradation may include leakage after a voltage is applied to an electrochemical device after a time period (e.g., 5 hours). In some cases, an electrochemical device at a first edge having a relatively high voltage may increase the most rapidly as an applied voltage increases. In some cases, the electrochemical device at a second edge also having a similar voltage as the voltage at the first edge may increase almost as rapidly as the first edge as an applied voltage increases. In some cases, an electrochemical device at a center having a relatively lower voltage (e.g., compared to the higher voltage of the first edge and the second edge) may increase less rapidly compared to the first edge and the second edge as an applied voltage increases. In some cases, a new material (e.g., a new electrochemical device) may have almost no leakage increase as an applied voltage increases. Accordingly, leakage degradation at edges of an electrochromic device may be highest when higher stack voltage is present.

[0029] The embodiments described herein may be based on a linkage of leakage degradation to an underlying electrochemical degradation mechanism that exhibits a voltage threshold. For example, leakage degradation for electrochromic devices may include an oxygen reaction at high voltage (>4.5V vs. Li) in electrode materials, irreversible electrochemical reaction of electrode or electrolyte materials in contact with each other, secondary lithiation reactions at low or high voltage, such as in Li-Ni-W-0 systems, and lithium “trapping” mechanisms, such as in LiXWOY. In some aspects, voltage may be controlled on the electrochemical or electrochromic stack to ensure that the degradation threshold is not exceeded. Additionally, or alternatively, in some cases including stochastic degradation (e.g., dielectric breakdown of semiconductor interfaces) and kinetic-controlled degradation (e.g., operating above degradation threshold, but degradation rate may be an increasing function of voltage. For kinetic-controller degradation temperature may also affect the rate of degradation), minimization of applied voltage may also protect against degradation.

[0030] In some embodiments, a leakage (e.g., current (mA)) of an electrochemical device utilizing an oxygen reaction, >4.5v vs. Li may increase significantly as an applied voltage increases. Similarly, an electrochemical device at a second edge may also have a similar voltage as the voltage at the first edge increases the almost as rapidly as the first edge as an applied voltage increases. Stack voltage control on the electrochemical or electrochromic stack may ensure that the degradation threshold is not exceeded. Beyond controlling stack voltage below a degradation threshold, generally, minimization of applied voltage may help to protect against degradation in other cases including, for example, stochastic degradation (e.g., dielectric breakdown of semiconductor interfaces) and/or kinetic-controlled degradation (e.g., operating above degradation threshold, but degradation rate is an increasing function of voltage). In some aspects, for example with kinetic-controlled degradation, temperature may also affect the rate of degradation. The concepts provided herein may be implemented on electrochemical devices, including electrochromic devices, in order to protect the electrode and electrolyte materials.

[0031] In addition to electrochromic devices, many degradation mechanisms in electrochemical devices as a result of breaching voltage thresholds may incur including, for example, gas evolution from electrolyte decomposition in batteries and fuel cells, formation of secondary phases at electrode-electrolyte interfaces, anionic oxidation in Li-ion battery electrodes, and chemical expansion-induced fracture at two-phase interfaces. In each of these examples, the applied voltage may be maintained within a given stability window to protect the device from suffering capacity loss, impedance growth, shorting, or other performance and safety issues.

[0032] Leakage control may be used to control visual performance of electrochromic devices. For example, leakage control may be used to maintain good pane-to-pane and in-pane uniformity. For both pane-to-pain and in-pane uniformity, high leakage may affect an appearance of the devices or facades, directly impacting the usable lifetime of the devices. It should be understood that changes in coloration of a medium, which can include one or more layers, stacks, devices, etc., can be described as changes in the “transmission” level of the medium. As used hereinafter, transmission refers to the permittance of the passage of electromagnetic (EM) radiation, which can include visible light, through the medium, and a “transmission level” of the medium can refer to a transmittance of the medium. Where a medium changes transmission level, the medium may change from a clear transmission state (“full transmission level”) to a transmission level where a reduced proportion of incident EM radiation passes through the medium. Such a change in transmission level may cause the coloration or tint of the medium to change. For example, a medium which changes from a full transmission or tint level to a lower transmission or tint level may be observed to become more opaque, darker in coloration or tint etc.

[0033] For electrochromic devices, in some aspect, a degradation threshold may be defined differently or given different priority based on the customer of interest or film configuration. Reduction of stack voltage may also reduce a depth of tint. A trade-off between product lifetime and depth of tint may be considered for each customer depending on geographical location or facade geographical direction orientation. This trade-off may be considered if degradation kinetics are slow enough to cause sufficiently gradual performance loss over the lifetime of the product rather than catastrophic failure.

[0034] As described herein, leakage control may be used to maintain good pane-to-pane and in-pane uniformity. For pane-to-pain uniformity, in some aspects, excessive leakage may conflict with practical or engineering constraints placed on maximum power or applied voltage. This may lead to a reduction of stack voltage. Leakage-driven reduction of stack voltage may cause adjacent windows to be controlled at different voltages thereby diminishing pane-to-pane uniformity. For in-pane uniformity, localized or edge leakage may lead to a non-uniform voltage distribution across the device and non-uniform transparency. In addition to non-uniform transparency, parts of the device may experience local voltage higher than the target voltage further exacerbating degradation. Leakage degradation may be minimized because leakage directly impacts visual performance. [0035] Several examples are provided for a skewed stack voltage distribution across an electrochromic device according to some aspects. In some aspects, for a voltage distribution with no edge leakage, the stack voltage may increase to a target voltage threshold at a first edge of the electrochromic device and at a second edge of the electrochromic device. Also, the stack voltage may be at a minimum in the middle of the electrochromic device between the first edge and the second edge. A voltage distribution across an electrochromic device with no leakage may provide a unform coloration or tint across the electrochromic device. In some aspects, for a voltage distribution with edge leakage, the stack voltage may increase towards the target voltage threshold at the first edge of the electrochromic device and at the second edge of the electrochromic device. However, due to the leakage, the stack voltage increasing to the first edge may not reach the target voltage threshold. In addition, due to the leakage, the stack voltage increasing to the second edge may surpass the target voltage threshold. Further, the stack voltage may be at a minimum at a location that is offset from the middle of the electrochromic device and towards the first edge. A voltage distribution across an electrochromic device with leakage may provide a non-unform coloration or tint across the electrochromic device.

[0036] In some aspects, reducing stack voltage may increase voltage controllability. For example, electrochemical device exhibiting leakage current may accurately control stack voltage based on precise resistance information between the controller and the electrochemical device. At steady state, the actual voltage applied to the electrochemical device edges may depend on the target voltage, leakage current magnitude, and/or resistance errors. To avoid the degradation threshold, possible resistance errors A R may be accounted for using the following equation: where Vdegradation includes the degradation voltage, Vstack target includes the target voltage of the stack, A R includes resistance errors, and I includes the current through the stack. Reduction of Vstack target may have a desirable effect of reducing variance in the I A R term, since /(Vstack target) may be an increasing function. Therefore, stack voltage reduction may improve accuracy of stack voltage control. For example, leakage current distnbution and resistance error distribution may be used to determine voltage error distribution. The summation of the leakage current distribution and the resistance error distribution may provide the voltage error distribution. In some aspects, stack kinetics may also exhibit a degradation threshold. For example, in addition to leakage degradation, stack kinetics may also exhibit voltage threshold behavior. In some instances, an electrochromic stack device exposed to high voltages for sufficient time may exhibit permanent increases in impedance. Conversely, an electrochromic stack device may maintain a voltage below a threshold voltage may exhibit stable impedance. Electrochemical kinetics may have a significant effect on both switching speed and uniformity during switching.

[0037] In some aspects, for a first voltage, as the voltage exposure increases, the interfacial impedance of the stack may remain relatively constant over time. Conversely, for a second voltage that is greater than the first voltage, as the voltage exposure increases, the interfacial impedance of the stack may increase over time. For example, for the second voltage and for an initial amount of time, the interfacial impedance of the stack may remain constant. However, after the initial amount of time and for a second duration of time, the interfacial impedance of the stack may increase. Further, for the second voltage and for a third duration of time, the interfacial impedance of the stack may again remain constant. However, for a fourth duration of time and beyond, the interfacial impedance of the stack may again increase. For a third voltage that is greater than the first voltage VI and the second voltage V2, as the voltage exposure increases, the interfacial impedance of the stack may increase faster than the second voltage. Accordingly, electrochemical impedance may increase from exposure to high voltage, but may remain stable or relatively constant at sufficiently lower voltage. In some aspects, reduction of stack voltage may be accomplished by direct modifications to existing controls algorithms. Additionally, or alternatively, voltage applied elsewhere in the circuit may be adjusted accordingly to maintain lower stack voltage.

[0038] FIG. 1 shows an example electrochromic (EC) system according to some aspect. In this example, electrochromic system 100 may include electrochromic device 105 secured to substrate 110. For instance, electrochromic device 105 may include a thin film which may be deposited on to substrate 110. Electrochromic device 105 may include includes a first transparent conductive (TC) layer 124 and the second TC layer 126 in contact with substrate 110. In some embodiments, TC layer 124 and TC layer 126 may be, or may include, transparent conductive oxide (TCO) layers. Substrate 110 may include one or more optically transparent materials, e.g., glass, plastic, and the like. The electrochromic device 120 may also include counter electrode (CE) layer 128 in contact with the first TC layer 124, electrochromic electrode (EC) layer 130 in contact with the second TC layer 126, and ionic conductor (IC) layer 132 “sandwiched” in-between CE layer 128 and EC layer 130. Electrochromic system 100 may include power supply 140 which may provide regulated current or voltage to electrochromic device 105. Transparency of electrochromic device 105 may be controlled by regulating density of charges (or lithium ions) in CE layer 128 and/or EC layer 130 of electrochromic device 105. For instance, when electrochromic system 100 applies a positive voltage from power supply 140 to the first TC 124, lithium ions may be driven across IC layer 132 and inserted into EC layer 130. Simultaneously, charge-compensating electrons may be extracted from CE layer 128, flow across the external circuit, and get inserted into EC layer 130. Transfer of lithium ions and associated electrons from CE layer 128 to EC layer 130 may cause electrochromic device 105 to become darker - e.g., the visible light transmission or %T of electrochromic device 105 may decrease. Reversing the voltage polarity may cause the lithium ions and associated charges to return to their original layer, CE layer 128, and as a result, electrochromic device 105 may return to a clear state - e.g., the visible light transmission or %T of electrochromic device 105 may increase.

[0039] In some aspects, electric current flowing through the top and bottom transparent conductive oxide (TCO) layers may cause a voltage drop and varying local voltage may result in non-uniform in-plane appearance in electrochromic devices. The non-uniformity may increase when the top and bottom TCO layers have different sheet resistances. To limit non-uniformity, sheet resistance differences between two or more sheets may be maintain below a threshold resistance difference. In some aspects, transversal leakage current concentrated at edges of electrochromic devices may provide a lop-sided voltage distribution creating a non-uniform tinting appearance. Such leakage may occur due to natural process/materials variation or special processing at edges such as ablation, selective etching, passivation, laser scribes, lamination, or the like. Non-uniformity may increase when edge leakage increases. To limit non-uniformity, edge leakage may be controlled, for example, in order to have less than a 0.6V local voltage difference at glare control holding states and/or edge leakage should be less than 25% of the max allowed leakage current defined by a performance specifications.

[0040] In some aspects, a first voltage VI may have a moderate amount of leakage (e.g., about 2.50 mA/V/ft 2 ), a second voltage V2, that is greater than the first voltage VI, may have a lesser amount of leakage (e.g., about 2.00 mA/V/ft 2 ), and a third voltage V3, that is greater than second voltage V2, may have a greater amount of leakage (e.g., about 5.00 mA/V/ft 2 ) Accordingly, if a voltage is too high or too low, an optimal leakage level may not be reached. Further, the third voltage V3 being the highest voltage provide significantly greater leakage compared to the first voltage VI and the second voltage V2. Accordingly, electrochromic devices controlled at the highest voltage among electrochromic device cycled using various sequences may experience excessive leakage.

[0041] FIG. 2 illustrates an example environment 201 including a computer system 200 that may be used for generating a CGU configuration model according to some aspects. The computer system 200 may include a plurality of processors including processors 210a, 210b, through 210n. An I/O interface 230 may facilitate electronic communication between the processors, the system memory 220, the device interface 270 and the network interface 240. The network interface 240 may be in electronic communication with the other device(s) 260 via the network 250 and the device interface 270 may be in electronic communication with portable device(s) 280. The system memory 220 may include code 225 and data 226. The details concerning the processors 210a, 210b, through 210n, the I/O interface 230, the system memory 220 including the code 225 and the data 226, the device interface 260, the network interface 240, the portable device(s) 280, and the other device(s) 260 may be provided herein at least with respect to features of FIG. 16 including the processors 1610a, 1610b, through 161 On, the I/O interface 1630, the system memory 1620 including the code 1625 and the data 1626, the device interface 1670, the network interface 1640, the portable device(s) 1680, and the other device(s) 1660.

[0042] In some aspects, the system memory 220 may include a coated glass unit (CGU) configuration model. The CGU configuration model may be used to tune control parameters of CGUs to directly affect performance and long-term reliability of the CGUs. The processors (e.g., the processors 210a, 210b, through 210n) may build the CGU configuration model in order to tune control parameters. For example, the computer system 200 (hereinafter the “system 200”) may receive a plurality of control parameters 282 associated with a plurality of different CGUs. The control parameters may include steady state voltage, active tint voltage, tint voltage ramp rate, and the like. The system 200 may identify one or more reliability indices 284 associated with one or more control parameters of the plurality of control parameters. For example, the system 200 may identify CGU edge film kinetics levels, CGU center film kinetics levels, CGU edge film dynamic range levels, CGU center film dynamic range levels, dynamic range levels, leakage levels, shorts, dendrites, haze levels, and/or the like for a plurality of different control parameters. Each of the reliability indices may provide a correlation between performance of a GCU and a degradation level of the CGU based on one or more particular control parameters. In some aspects, the system 200 may receive a plurality of input parameters 286 such as size, dimensions, and/or type of CGU which may also affect reliability and performance. The system 200 may use the CGU configuration model 226 to tune a CGU according to a set of control parameters.

[0043] The system 200 may generate a CGU configuration model 226 of a series of relationships between performance and degradation of CGUs based on the one or more reliability indices and at least one control parameter of the plurality of control parameters for specifying a set of control parameters of the plurality of control parameters according to at least one of a specified performance level or a specified degradation level. The specified performance level may include at least one of a specified steady state performance level or a specified transition performance level. For example, the specified performance level may include full tint lowest ITO resistance difference and/or %T level, steady state in-pane tint uniformity level, steady state pane- to-pane tint uniformity level, tint holding power consumption level, tint color level, tint haze level, tint color rendering index level, solar heat gain level, and/or the like. The specified transition performance level may include a tint transition speed level, tint transition in-pane uniformity level, tint transition pane-to-pain uniformity level, tint transition power consumption level, and/or the like. The specified degradation level may include a CGU edge film kinetics level, a CGU center film kinetics level, a CGU edge film dynamic range level, a CGU center film dynamic range level, a dynamic range level, a leakage level, shorts levels, a dendrite level, a haze level, and/or the like. [0044] Reliability indices provide relationships between performance and degradation. For example, faster tint transition speeds typically lead to poorer tint transition uniformity. Thus, the faster a CGU transitions between tint levels, the less uniform the tint or tint change of the GCU may be during and/or after transition. Conversely, the slower a CGU transitions between tint levels, the more uniform the tint or tint change of the GCU may be during and/or after transition. As another example, faster tint transition speeds typically lead faster device edge film degradation. Thus, the faster a CGU transitions between tint levels, the faster device edge film degradation occurs for the GCU. Conversely, the slower a CGU transitions between tint levels, the slower device edge film degradation occurs for the GCU. As yet another example, if in-pane uniformity is worse than a threshold uniformity, then pane-to-pane uniformity is moot. Thus, if in-pane uniformity is worse than a threshold uniformity, then it will be very difficult to achieve pane-to- pane uniformity for a CGU regardless of the resistances between the panes. Conversely, if in-pane uniformity is not worse than a threshold uniformity, then pane-to-pane uniformity for a CGU may be achievable. As another example, higher tint voltage typically leads to faster device edge and center film degradation. Thus, the higher a tint voltage is for a CGU, the faster device edge and center film degradation occurs. Conversely, the lower a tint voltage is for a CGU, the slower device edge and center film degradation occurs. The CGU configuration model 226 may use the reliability indices to determine a particular degradation level for a specified performance level and determine a particular performance level for a specified degradation level. Also, it should be understood that while degradation effects include degradation with respect to uniformity, other degradation (e.g., kinetics, shorts, leakages, failures to switch, or the like) may also be addressed using the CGU configuration model 226.

[0045] FIG. 3 illustrates an example environment 301 including the computer system 200 that may be used for implementing a CGU configuration model according to some aspects. As described, the system 200 may have generated a CGU configuration model 226 of a series of relationships between performance and degradation of CGUs based on the one or more reliability indices and at least one control parameter of the plurality of control parameters for specifying a set of control parameters of the plurality of control parameters according to at least one of a specified performance level or a specified degradation level. Using the CGU configuration model 226, the system 200 may receive at least one of a specified performance level from the plurality of performance levels 386 or a specified degradation level from the plurality of degradation levels, and determine the set of control parameters of the plurality of control parameters 282 associated with at least one of the specified performance level or the specified degradation level. For example, the system 200 may receive the specified performance level of a high steady state in-pane uniformity level. Using the CGU configuration model 226, the system 200 may determine a steady state voltage range, an active tint voltage range, a tint voltage ramp rate range, and/or the like to achieve the high steady state in-pane uniformity level for a particular CGU. As another example, the system 200 may receive the specified degradation level of a low leakage level. Using the CGU configuration model 226, the system 200 may determine steady state voltage range, an active tint voltage range, a tint voltage ramp rate range, and/or the like to achieve the low-leakage level for a particular CGU. The system 200, based on the CGU configuration model 226 may tune the CGU to meet the specified performance level and/or the specified degradation level according to the determined set of control parameters.

[0046] In some aspects, the system 200 may utilize the CGU configuration model 226 may specify a performance level and/or a degradation level according to one or more control parameters. For instance, the system 200 may receive a set of control parameters of the plurality of control parameters, and determine, using the CGU configuration model, at least one of the specified performance level or the specified degradation level associated with the set of control parameters of the plurality of control parameters. For example, the system 200 may receive the specified control parameter(s) of a high steady state voltage, a high active tint voltage, a high tint voltage ramp rate, and/or the like. Using the CGU configuration model 226, the system 200 may determine a specified steady state performance level or a specified transition performance level that correlates with specified control parameter(s). As another example, the system 200 may receive the specified control parameter(s) of a low steady state voltage, a low active tint voltage, a low tint voltage ramp rate, and/or the like. Using the CGU configuration model 226, the system 200 may determine a degradation level that correlates with specified control parameter(s).

[0047] In some aspects, the system 200 may receive an initial set of control parameters associated with a specific CGU. The initial set of control parameters may include at least one an initial voltage or an initial current associated with the specific CGU. The system 200 may estimate a voltage distribution across the specific CGU based on the initial set of control parameters and determine, using the CGU configuration model, at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution across the specific CGU The system 200 may determine at least one of whether the initial performance level comprises an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for the specified performance level, or whether the initial degradation level comprises an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for the specified degradation level. The initial performance level and/or the specific performance level may be associated with average tint levels of the specific CGU. The initial degradation level and the specific degradation level may be associated with in-pane uniformity of the specific CGU. The initial set of control parameters associated with the specific CGU may include at least one of tint holding control parameters or tint transitioning control parameters. The voltage distribution across the specific CGU may include an edge-to-center stack voltage distribution across the specific CGU.

[0048] The system 200 may provide an indication for repair of the specific CGU or replacement of the specific CGU with a new CGU in response to determining at least one of that the initial performance level comprises the in-pane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level comprises the in-pane uniformity level of the specific CGU that is outside the in-pane uniformity level range for the specified degradation level. Additionally, or alternatively, the system 200 may determine a specified set of control parameters for the specific CGU based on at least one of the initial performance level or the initial degradation level and in accordance with at least one of the specified performance level or the specified degradation level for the specific CGU. The specified set of control parameters may include at least one of a specified voltage for the specific CGU or a specified current for the specific CGU for improving voltage uniformity across the specific CGU. The system 200 may tune the CGU to meet the specified performance level and/or the specified degradation level according to the determined set of control parameters. [0049] In some aspects, the system 200 may receive a plurality of input parameters associated with CGUs. As described herein, input parameters may include a size, a shape, or a type of CGU. The system 200 may identify the one or more reliability indices associated with the one or more control parameters of the plurality of control parameters in accordance with one or more input parameters of the plurality of input parameters. The system 200 may generate the CGU configuration model of the series of relationships between performance and degradation of CGUs based on the one or more reliability' indices and the one or more control parameters of the plurality of control parameters in accordance with at least one input parameter of the plurality of input parameters for specifying the set of control parameters of the plurality of control parameters according to at least one of the specified performance level or the specified degradation level. Subsequently, the system 200 may receive at least one of the specified performance level or the specified degradation level and one or more specified input parameters of the plurality of input parameters. Using the CGU configuration model 226, the system 200 may determine a set of control parameters of the plurality of control parameters in accordance with the one or more specified input parameters and associated with at least one of the specified performance level or the specified degradation level. In some aspects, the system 200 may receive the set of control parameters of the plurality of control parameters and one or more specified input parameters of the plurality of input parameters. Using the CGU configuration model 226, the system 200 may determine at least one of the specified performance level or the specified degradation level in accordance with the one or more specified input parameters and associated with the set of control parameters of the plurality of control parameters.

[0050] In some instances, the system 200 may receive an initial set of control parameters associated with a specific CGU. The initial set of control parameters may include at least one an initial voltage or an initial current associated with the specific CGU. The system 200 receive a set of input parameters associated with the specific CGU. The set of input parameters may include at least a physical dimension of the specific CGU. The system 200 may estimate a voltage distribution across the specific CGU based on the initial set of control parameters and the set of input parameters and determine, using the CGU configuration model, at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution across the specific CGU. The system 200 may then determine at least one of whether the initial performance level comprises an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for the specified performance level, or whether the initial degradation level comprises an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for the specified degradation level.

[0051] FIG. 4 illustrates an example diagram 400 conceptualizing a relationship between CGU performance and reliability according to some aspects. As shown in FIG. 4, reliability 402 of a CGU may be opposed to transition performance 404 of a CGU and steady state performance 406 of a CGU. Similarly, transition performance 404 of a CGU may be opposed to reliability 402 of a CGU and steady state performance 406 of a CGU. Also, steady state performance 406 of a CGU may be opposed to reliability 402 of a CGH and transition performance 404 of a CGU. In other words, to increase reliability 402 of a CGU, transition performance 404 and steady state performance 406 may be sacrificed, to increase transition performance 404 of a CGU, reliability 402 and steady state performance 406 may be sacrificed, and to increase steady state performance 406 of a CGU, reliability 402 and transition performance 404 may be sacrificed. Thus, a CGU may have different control configurations based on CGU operating preferences. For example, for a first control configuration 410, a CGU may have slow tint voltage ramp rate level, medium (e.g., intermediate speed) active tint voltage level, and medium (e.g., intermediate) tint hold voltage level. The first control configuration 410 may favor reliability while tint transition is slow but relatively uniform. As another example, for a second control configuration 412, a CGU may have medium tint voltage ramp rate level, medium active tint voltage level, and high tint hold voltage level. The second control configuration 412 may favor glare control at full tint and have a medium or intermediate long-term reliability. As yet another example, for athird control configuration 414, a CGU may have fast tint voltage ramp rate level, high active tint voltage level, and medium tint hold voltage level. The third control configuration 414 may favor tint transition speed, while meeting basic or a lower level of reliability requirements. In some aspects, steady state performance 406 may be characterized by full tint lowest ITO resistance difference and/or %T level, steady state in-pane tint uniformity level, steady state pane-to-pane tint uniformity level, tint holding power consumption level, tint color level, tint haze level, tint color rendering index level, solar heat gain level, and/or the like. In some aspects, transition performance 404 may be characterized by tint transition speed level, tint transition in-pane uniformity level, tint transition pane-to-pain uniformity level, tint transition power consumption level, and/or the like.

[0052] FIG. 5 illustrates an example method 500 for tuning a coated glass unit (CGU) according to some aspects. The method may be performed by one or more systems described herein (e.g., the computer system 200 illustrated in FIG. 2, the computer system 300 illustrated in FIG. 3, computer system 1600 illustrated in FIG. 16) and may be performed with a variety of different types of coated glass units (CGUs) such as an EC device (e.g., electrochromic system 100 illustrated in FIG. 1 ). The method 500 may include one or more same or similar features as the methods and systems described herein and with respect to any of FIGs. 1-4, and 6-15. At operation 502, a system may receive a plurality of control parameters associated with coated glass units (CGUs). At operation 504, the system may identify one or more reliability indices associated with one or more control parameters of the plurality of control parameters. At operation 506, the system may generate a CGU configuration model of a series of relationships between performance and degradation of CGUs based on the one or more reliability indices and at least control parameter of the plurality of control parameters according to at least one of a specified performance level or a specified degradation level. The specified performance level may include at least one a specified steady state performance level or a specified transition performance level. At operation 508, the system may tune, based on the CGU configuration model, a CGU according to the set of control parameters.

[0053] In some aspects, the system may receive at least one of the specified performance level or the specified degradation level and determine, using the CGU configuration model, the set of control parameters of the plurality of control parameters associated with at least one of the specified performance level or the specified degradation level. In some aspects, the system may receive the set of control parameters of the plurality of control parameters and determine, using the CGU configuration model, at least one of the specified performance level or the specified degradation level associated with the set of control parameters of the plurality of control parameters.

[0054] In some instances, the system may receive an initial set of control parameters associated with a specific CGU. The initial set of control parameters may include at least one an initial voltage or an initial current associated with the specific CGU. The system may estimate a voltage distribution across the specific CGU based on the initial set of control parameters and determine, using the CGU configuration model, at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution across the specific CGU. The system may then determine at least one of whether the initial performance level includes an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for the specified performance level, or whether the initial degradation level includes an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for the specified degradation level.

[0055] The system may receive a plurality of input parameters associated with CGUs. The system may then identify the one or more reliability indices associated with the one or more control parameters of the plurality of control parameters in accordance with one or more input parameters of the plurality of input parameters. The system may generate the CGU configuration model of the series of relationships between performance and degradation of CGUs based on the one or more reliability indices and the one or more control parameters of the plurality of control parameters in accordance with at least one input parameter of the plurality of input parameters for specifying the set of control parameters of the plurality of control parameters according to at least one of the specified performance level or the specified degradation level. In some cases, the system may receive at least one of the specified performance level or the specified degradation level. The system may receive one or more specified input parameters of the plurality of input parameters. Subsequently, the system may determine, using the CGU configuration model, the set of control parameters of the plurality of control parameters in accordance with the one or more specified input parameters and associated with at least one of the specified performance level or the specified degradation level. In some aspects, the system may receive the set of control parameters of the plurality of control parameters, receive one or more specified input parameters of the plurality of input parameters and determine, using the CGU configuration model, at least one of the specified performance level or the specified degradation level in accordance with the one or more specified input parameters and associated with the set of control parameters of the plurality of control parameters. In some aspects, the system may receive an initial set of control parameters associated with a specific CGU. The initial set of control parameters may include at least one an initial voltage or an initial current associated with the specific CGU. The system may then receive a set of input parameters associated with the specific CGU. The set of input parameters may include at least a physical dimension of the specific CGU. The system may estimate a voltage distribution across the specific CGU based on the initial set of control parameters and the set of input parameters and determine, using the CGU configuration model, at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution across the specific CGU. Subsequently, the system may determine at least one of whether the initial performance level includes an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for the specified performance level, or whether the initial degradation level includes an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for the specified degradation level.

[0056] FIG. 6 illustrates an example method 600 for tuning a coated glass unit (CGU) according to some aspects. The method may be performed by one or more systems described herein (e.g., the computer system 200 illustrated in FIG. 2, the computer system 300 illustrated in FIG. 3, computer system 1600 illustrated in FIG. 16) and may be performed with a variety of different types of coated glass units (CGUs) such as a EC device (e g., electrochromic system 100 illustrated in FIG. 1). The method 600 may include one or more same or similar features as the methods and systems described herein and with respect to any of FIGs. 1-5, and 7-15. At operation 602, a system may receive a plurality of control parameters associated with coated glass units (CGUs). At operation 604, the sy stem may identify one or more reliability indices associated with one or more control parameters of the plurality of control parameters. At operation 606, the system may generate a CGU configuration model of a series of relationships between performance and degradation of CGUs based on the one or more reliability indices and at least control parameter of the plurality of control parameters according to at least one of a specified performance level or a specified degradation level. The specified performance level may include at least one a specified steady state performance level or a specified transition performance level. At operation 608, the system may receive at least one specified performance level or the specified degradation level. At operation 610, the system may determine, using the CGU configuration model, the set of control parameters of the plurality of control parameters associated with at least one of the specified performance level or the specified degradation level. At operation 612, the system may tune, based on the CGU configuration model, a CGU according to the set of control parameters.

[0057] FIG. 7 illustrates an example method 700 for tuning a coated glass unit (CGU) according to some aspects. The method may be performed by one or more systems described herein (e.g., the computer system 200 illustrated in FIG. 2, the computer system 300 illustrated in FIG. 3, computer system 1600 illustrated in FIG. 16) and may be performed with a variety of different types of coated glass units (CGUs) such as an EC device (e.g., electrochromic system 100 illustrated in FIG. 1). The method 700 may include one or more same or similar features as the methods and systems described herein and with respect to any of FIGs. 1-6, and 8-15. At operation 702, a system may receive a plurality of control parameters associated with coated glass units (CGUs). At operation 704, the system may identify one or more reliability indices associated with one or more control parameters of the plurality of control parameters. At operation 706, the system may generate a CGU configuration model of a series of relationships between performance and degradation of CGUs based on the one or more reliability indices and at least control parameter of the plurality of control parameters according to at least one of a specified performance level or a specified degradation level. The specified performance level may include at least one of a specified steady state performance level or a specified transition performance level. At operation 708, the system may receive the set of control parameters of the plurality of control parameters. At operation 710, the system may determine, using the CGU configuration model, at least one of the specified performance level or the specified degradation level associated with the set of control parameters of the plurality of control parameters. At operation 712, the system may tune, based on the CGU configuration model, a CGU according to at least one of the specified performance level or the specified degradation level.

[0058] FIG. 8 illustrates an example method 800 for tuning a coated glass unit (CGU) according to some aspects. The method may be performed by one or more systems described herein (e.g., the computer system 200 illustrated in FIG. 2, the computer system 300 illustrated in FIG. 3, computer system 1600 illustrated in FIG. 16) and may be performed with a variety of different types of coated glass units (CGUs) such as an EC device (e.g., electrochromic system 100 illustrated in FIG. 1). The method 800 may include one or more same or similar features as the methods and systems described herein and with respect to any of FIGs. 1-7 and 9-15. At operation 802, a system may receive a plurality of control parameters associated with coated glass units (CGUs). At operation 804, the system may identify one or more reliability indices associated with one or more control parameters of the plurality of control parameters. At operation 806, the system may generate a CGU configuration model of a series of relationships between performance and degradation of CGUs based on the one or more reliability indices and at least control parameter of the plurality of control parameters according to at least one of a specified performance level or a specified degradation level. The specified performance level may include at least one a specified steady state performance level or a specified transition performance level. At operation 808, the system may receive an initial set of control parameters associated with a specific CGU. The initial set of control parameters may include at least one an initial voltage or an initial current associated with the specific CGU. At operation 810, the system may estimate a voltage distribution across the specific CGU based on the initial set of control parameters. At operation 812, the system may determine, using the CGU configuration model, at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution across the specific CGU. At operation 814, the system may determine at least one of whether the initial performance level includes an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for the specified performance level, or whether the initial degradation level includes an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for the specified degradation level.

[0059] FIG. 9 illustrates an example method 900 for tuning a coated glass unit (CGU) according to some aspects. The method may be performed by one or more systems described herein (e.g., the computer system 200 illustrated in FIG. 2, the computer system 300 illustrated in FIG. 3, computer system 1600 illustrated in FIG. 16) and may be performed with a variety of different types of coated glass units (CGUs) such as a EC device (e.g., electrochromic system 100 illustrated in FIG. 1). The method 900 may include one or more same or similar features as the methods and systems described herein and with respect to any ofFIGs. 1-8 and 10-15. At operation 902, a system may receive a plurality' of control parameters associated with coated glass units (CGUs) and a plurality of input parameters associated with GCUs. At operation 904, the system may identify one or more reliability indices associated with one or more control parameters of the plurality of control parameters in accordance with one or more input parameters of the plurality of input parameters. At operation 906, the system may generate a CGU configuration model of the series of relationships between performance and degradation of CGUs based on the one or more reliability indices and the one or more control parameters of the plurality of control parameters in accordance with at least one input parameter of the plurality of input parameters for specifying the set of control parameters of the plurality of control parameters according to at least one of the specified performance level or the specified degradation level. At operation 908, the system may tune, based on the CGU configuration model, a CGU according to the set of control parameters.

[0060] FIG. 10 illustrates an example method 1000 for tuning a coated glass unit (CGU) according to some aspects. The method may be performed by one or more systems described herein (e.g., the computer system 200 illustrated in FIG. 2, the computer system 300 illustrated in FIG. 3, computer system 1600 illustrated in FIG. 16) and may be performed with a variety of different types of coated glass units (CGUs) such as an EC device (e.g., electrochromic system 100 illustrated in FIG. 1). The method 1000 may include one or more same or similar features as the methods and systems described herein and with respect to any of FIGs. 1-9 and 11-15. At operation 1002, a system may receive a plurality of control parameters associated with coated glass units (CGUs) and a plurality of input parameters associated with CGUs. At operation 1004, the system may identify one or more reliability indices associated with one or more control parameters of the plurality of control parameters in accordance with one or more input parameters of the plurality of input parameters. At operation 1006, the system may generate a CGU configuration model of the series of relationships between performance and degradation of CGUs based on the one or more reliability indices and the one or more control parameters of the plurality of control parameters in accordance with at least one input parameter of the plurality of input parameters for specifying the set of control parameters of the plurality of control parameters according to at least one of the specified performance level or the specified degradation level. At operation 1008, the system may receive at least one specified performance level or the specified degradation level and one or more specified input parameters of the plurality of input parameters. At operation 1010, the system may determine, using the GCU configuration model, the set of control parameters of the plurality of control parameters in accordance with the one or more specified input parameters and associated with at least one of the specified performance level or the specified degradation level. At operation 1012, the system may tune, based on the CGU configuration model, a CGU according to the set of control parameters.

[0061] FIG. 11 illustrates an example method 1100 for tuning a coated glass unit (CGU) according to some aspects. The method may be performed by one or more systems described herein (e.g., the computer system 200 illustrated in FIG. 2, the computer system 300 illustrated in FIG. 3, computer system 1600 illustrated in FIG. 16) and may be performed with a variety of different types of coated glass units (CGUs) such as a EC device (e.g., electrochromic system 100 illustrated in FIG. 1). The method 1100 may include one or more same or similar features as the methods and systems described herein and with respect to any of FIGs. 1-10 and 12-15. At operation 1102, a system may receive a plurality of control parameters associated with coated glass units (CGUs) and a plurality of input parameters associated with CGUs. At operation 1104, the system may identify one or more reliability indices associated with one or more control parameters of the plurality of control parameters in accordance with one or more input parameters of the plurality of input parameters. At operation 1106, the system may generate a CGU configuration model of the series of relationships between performance and degradation of CGUs based on the one or more reliability indices and the one or more control parameters of the plurality of control parameters in accordance with at least one input parameter of the plurality of input parameters for specifying the set of control parameters of the plurality of control parameters according to at least one of the specified performance level or the specified degradation level. At operation 1108, the system may receive the set of control parameters of the plurality of control parameters and one or more specified input parameters of the plurality of input parameters. At operation 1110, the system may determine, using the CGU configuration model, at least one of the specified performance level or the specified degradation level in accordance with the one or more specified input parameters and associated with the set of control parameters of the plurality of control parameters. At operation 1112, the system may tune, based on the CGU configuration model, a CGU according to at least one of the specified performance level or the specified degradation level.

[0062] FIG. 12 illustrates an example method 1200 for tuning a coated glass unit (CGU) according to some aspects. The method may be performed by one or more systems described herein (e.g., the computer system 200 illustrated in FIG. 2, the computer system 300 illustrated in FIG. 3, computer system 1600 illustrated in FIG. 16) and may be performed with a variety of different types of coated glass units (CGUs) such as an EC device (e.g., electrochromic system 100 illustrated in FIG. 1). The method 1200 may include one or more same or similar features as the methods and systems described herein and with respect to any of FIGs. 1-11 and 13-15. At operation 1202, a system may receive a plurality of control parameters associated with coated glass units (CGUs) and a plurality of input parameters associated with GCUs. At operation 1204, the system may identify one or more reliability indices associated with one or more control parameters of the plurality of control parameters in accordance with one or more input parameters of the plurality of input parameters. At operation 1206, the sy stem may generate a CGU configuration model of the series of relationships between performance and degradation of CGUs based on the one or more reliability indices and the one or more control parameters of the plurality of control parameters in accordance with at least one input parameter of the plurality of input parameters for specifying the set of control parameters of the plurality of control parameters according to at least one of the specified performance level or the specified degradation level. At operation 1208, the system may receive an initial set of control parameters associated with a specific CGU, wherein the initial set of control parameters comprises at least one an initial voltage or an initial current associated with the specific CGU. At operation 1210, the system may receive a set of input parameters associated with the specific CGU, wherein the set of input parameters comprises at least a physical dimension of the specific CGU. At operation 1212, the system may estimate a voltage distribution across the specific CGU based on the initial set of control parameters and the set of input parameters. At operation 1214, the system may determine, using the CGU configuration model, at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution across the specific CGU. At operation 1216, the system may determine at least one of whether the initial performance level comprises an inpane transmission level of the specific CGU that is outside an in-pane transmission level range for the specified performance level, or whether the initial degradation level comprises an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for the specified degradation level.

[0063] In some aspects, optical performance (pane-to-pane matching, in-pane uniformity) may be critical for customer experience. In the field, no optical sensor may be installed to monitor optical performance of electrochromic glass. It may be important for a controller to estimate inpane uniformity and IGU average tint level during transition and holding, without using optical sensors. For example, a controller may provide a pane-to-pane assessment to match performance, an assessment of in-pane uniformity, and/or an assessment of IGU health status for triggered protective control strategy to prevent further degrade IGU, (2) to notify a maintenance team for further diagnostics or replacement. The controller may thus improve control accuracy using inpane uniformity estimation and provide edge-to-center stack voltage estimation using voltage and current.

[0064] Both approaches may start from an IGU model including ITO and EC stacks. Analytical solutions may include formulating and solving differential equations directly. This closed-form formula may be implemented directly with low cost in controllers or on the cloud. However, this solution may only handle linear models or limited cases of nonlinear models. Analytical solutions may also include numerical solutions. For example, numerical solutions may include formulating and solving differential equations using numerical solvers. This solution may handle nonlinear models and 2D (harmony) cases. With this solution, however, computational costs may be high, and may be better implemented in servers or on the cloud. This solution may require optimization/simphfication if implemented in controllers.

[0065] In some aspects, an electrochromic device may be used to illustrate edge-to-center stack voltage estimation with an input of edge stack voltage, size, and current and an output of center stack voltage. In some aspects, with an improved in-field voltage estimation, an edge may be at a much higher voltage than a current controller may detect. Non-uni formi ty as indicated by maximum local voltage difference versus top and bottom ITO resistance difference in devices with and without concentrated edge leakage. Moreover, the lop-sided voltage distribution induced by mismatched ITO may be a potential catalyst of device degradation, because one side of the device can be at higher stack voltages than the degradation threshold. The overvoltage may in turn make the device look less uniform when the leakage increases as a result of degradation.

[0066] In some aspect, evolving leakage may be a concerning problem to the control system of electrochromic devices. In addition to non-uniform appearance, the lop-sided voltage distribution induced by edge leakage may lead to degradation at the counter edge of the device, when that edge is subj ect to a higher stack voltage than the degradation threshold. The edge leakage induced overvoltage may get exacerbated when top and bottom transparent conductive oxide layers are of different sheet resistances. Leakage increase may be one of the notorious degradation symptoms in electrochemical systems. Consequently, the overvoltage may then cause a more severe uniformity issue across the device with leaky edge. Thus, with increased resistance difference between TCOs of an electrochromic device, as edge leakage percentage increases, the voltage difference between edge voltage and target voltage increases faster compared to TCOs with less resistance differences.

[0067] In some aspects, non-uniformity may be indicated by maximum local voltage difference (Vmax -Vmin) versus top and bottom ITO resistance difference (Rsq,top-Rsq, bottom) in devices with and without concentrated edge leakage. Moreover, the lop-sided voltage distribution induced by mismatched ITO may be a potential catalyst of device degradation, because one side of the device can be at higher stack voltages than the degradation threshold. The overvoltage may in turn make the device look less uniform when the leakage increases as a result of degradation. In some aspects, evolving leakage may be a concerning problem to the control system of electrochromic devices. In addition to non-uniform appearance, the lop-sided voltage distribution induced by edge leakage may lead to degradation at the counter edge of the device, when that edge is subject to a higher stack voltage than the degradation threshold. The edge leakage induced nonuniformity may get exacerbated when top and bottom ITOs are of different sheet resistances. Leakage increase may be one of the notorious degradation symptoms in electrochemical systems. Thus, with increased resistance difference between ITOs of an electrochromic device, as edge leakage percentage increases, the voltage difference between edge voltage (Vedge) and target voltage (V target) increases faster compared to ITOs with less resistance differences. [0068] In some aspects, an RSQ and/or leakage from voltage and/or percent T (T%) may be estimated. No additional leakage may be induced by measurement probes. Input data may be T% once V-Q-T% is mapped. In some aspects, non-ohmic leakage modelling may be used. In some aspects, stead state stack voltage with non-ohmic leakage may be examined. In some aspects, RSQ may be designed for constant stack voltage.

[0069] FIG. 13 illustrates an example method 1300 for estimating optical performance of a coated glass unit (CGU) according to some aspects. The method may be performed by one or more systems described herein (e.g., the computer system 200 illustrated in FIG. 2, the computer system 300 illustrated in FIG. 3, computer system 1600 illustrated in FIG. 16) and may be performed with a variety of different types of coated glass units (CGUs) such as a EC device (e.g., electrochromic system 100 illustrated in FIG. 1). The method 1300 may include one or more same or similar features as the methods and systems described herein and with respect to any of FIGs. 1-12, 14, and 15. At operation 1302, a system may receive an initial set of control parameters associated with a specific coated glass unit (CGU), where the initial set of control parameters comprises at least one an initial voltage or an initial current associated with the specific CGU. The initial set of control parameters associated with the specific CGU may include at least one of tint holding control parameters or tint transitioning control parameters. At operation 1304, the system may estimate a voltage distribution across the specific CGU based on the initial set of control parameters. The voltage distribution across the specific CGU comprises an edge-to-center stack voltage distribution across the specific CGU. At operation 1306, the system may determine at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution. The initial degradation level and the specific degradation level may be associated with m-pane uniformity of the specific CGU. At operation 1308, the system may determine at least one of whether the initial performance level comprises an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for a specified performance level, or whether the initial degradation level comprises an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for a specified degradation level. The specified performance level may include at least one of a specified steady state performance level or a specified transition performance level. In some aspects, the initial performance level and the specific performance level may be associated with average tint levels of the specific CGU.

[0070] At operation 1310, the system may initiate one or more repair or replacement operations for the specified CGU in response to determining at least one of that the initial performance level comprises the in-pane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level comprises the in-pane uniformity level of the specific CGU that is outside the in-pane uniformity level range for the specified degradation level. For example, the system may change one or more manufacturing processes of the CGU in order to repair or replace the CGU. For instance, the system may command one or more devices to move the CGU to a repair operations station to initiate one or more repairs or to a disposal station to dispose of the CGU and to initiate the manufacturing of another CGU. The repair operations may include one or cuts or laser cuts through the CGU to improve performance or reduce degradation of the CGU. As another example, the system may activate a cutting tool (e.g., a laser) to make one or more repair cuts to the CGU. [0071] In some aspects, the system may also provide an indication for repair of the specific CGU or replacement of the specific CGU with a new CGU in response to determining at least one of that the initial performance level includes the in-pane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level includes the in-pane uniformity level of the specific CGU that is outside the in-pane uniformity level range for the specified degradation level. The system may further determine a specified set of control parameters for the specific CGU based on at least one of the initial performance level or the initial degradation level and in accordance with at least one of the specified performance level or the specified degradation level for the specific CGU. The specified set of control parameters may include at least one of a specified voltage for the specific CGU or a specified current for the specific CGU for improving voltage uniformity across the specific CGU. [0072] FIG. 14 illustrates an example method 1400 for estimating optical performance of a coated glass unit (CGU) according to some aspects. The method may be performed by one or more systems described herein (e.g., the computer system 200 illustrated in FIG. 2, the computer system 300 illustrated in FIG. 3, computer system 1600 illustrated in FIG. 16) and may be performed with a variety of different types of coated glass units (CGUs) such as an EC device (e.g., electrochromic system 100 illustrated in FIG. 1). The method 1400 may include one or more same or similar features as the methods and systems described herein and with respect to any of FIGs. 1-13 and 15. At operation 1402, a system may receive an initial set of control parameters associated with a specific coated glass unit (CGU), where the initial set of control parameters comprises at least one an initial voltage or an initial current associated with the specific CGU. At operation 1404, the system may estimate a voltage distribution across the specific CGU based on the initial set of control parameters. At operation 1406, the system may determine at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution. At operation 1408, the system may determine at least one of whether the initial performance level comprises an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for a specified performance level, or whether the initial degradation level comprises an in-pane uniformity level of the specific CGU that is outside an inpane uniformity level range for a specified degradation level. The specified performance level may include at least one of a specified steady state performance level or a specified transition performance level. At operation 1410, the system may provide an indication for repair of the specific CGU or replacement of the specific CGU with a new CGU in response to determining at least one of that the initial performance level includes the in-pane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level includes the m-pane uniformity level of the specific CGU that is outside the in-pane uniformity level range for the specified degradation level.

[0073] At operation 1412, the system may initiate one or more repair or replacement operations for the specified CGU in response to determining at least one of that the initial performance level comprises the in-pane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level comprises the in-pane uniformity level of the specific CGU that is outside the in-pane uniformity level range for the specified degradation level. For example, the system may change one or more manufacturing processes of the CGU in order to repair or replace the CGU. For instance, the system may command one or more devices to move the CGU to a repair operations station to initiate one or more repairs or to a disposal station to dispose of the CGU and to initiate the manufacturing of another CGU. The repair operations may include one or cuts or laser cuts through the CGU to improve performance or reduce degradation of the CGU. As another example, the sy stem may activate a cutting tool (e.g., a laser) to make one or more repair cuts to the CGU.

[0074] FIG. 15 illustrates an example method 1500 for estimating optical performance of a coated glass unit (CGU) according to some aspects. The method may be performed by one or more systems described herein (e.g., the computer system 200 illustrated in FIG. 2, the computer system 300 illustrated in FIG. 3, computer system 1600 illustrated in FIG. 16) and may be performed with a variety of different types of coated glass units (CGUs) such as an EC device (e.g., electrochromic system 100 illustrated in FIG. 1). The method 1500 may include one or more same or similar features as the methods and systems described herein and with respect to any of FIGs. 1-14. At operation 1502, a system may receive an initial set of control parameters associated with a specific coated glass unit (CGU), where the initial set of control parameters comprises at least one an initial voltage or an initial current associated with the specific CGU. At operation 1504, the system may estimate a voltage distribution across the specific CGU based on the initial set of control parameters. At operation 1506, the system may determine at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution. At operation 1508, the system may determine at least one of whether the initial performance level comprises an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for a specified performance level, or whether the initial degradation level comprises an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for a specified degradation level. The specified performance level may include at least one of a specified steady state performance level or a specified transition performance level. At operation 1510, the system may determine a specified set of control parameters for the specific CGU based on at least one of the initial performance level or the initial degradation level and in accordance with at least one of the specified performance level or the specified degradation level for the specific CGU. The specified set of control parameters may include at least one of a specified voltage for the specific CGU or a specified current for the specific CGU for improving voltage uniformity across the specific CGU.

[0075] At operation 1512, the system may initiate one or more repair or replacement operations for the specified CGU in response to determining at least one of that the initial performance level comprises the in-pane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level comprises the in-pane uniformity level of the specific CGU that is outside the in-pane uniformity level range for the specified degradation level. For example, the system may change one or more manufacturing processes of the CGU in order to repair or replace the CGU. For instance, the system may command one or more devices to move the CGU to a repair operations station to initiate one or more repairs or to a disposal station to dispose of the CGU and to initiate the manufacturing of another CGU. The repair operations may include one or cuts or laser cuts through the CGU to improve performance or reduce degradation of the CGU. As another example, the system may activate a cutting tool (e.g., a laser) to make one or more repair cuts to the CGU. [0076] In some aspects, an electronic device is provided. The electronic device may include a memory and one or more controllers. The one or more controllers may be configured to receive a plurality of control parameters associated with coated glass units (CGUs). The one or more controllers may also be configured to identify one or more reliability indices associated with one or more control parameters of the plurality of control parameters. The one or more controllers may further be configured to generate a CGU configuration model of a series of relationships between performance and degradation of CGUs based on the one or more reliability indices and at least one control parameter of the plurality of control parameters for specifying a set of control parameters of the plurality of control parameters according to at least one of a specified performance level or a specified degradation level. The specified performance level may include at least one of a specified steady state performance level or a specified transition performance level. In addition, the one or more controllers may be configured to tune, based on the CGU configuration model, a CGU according to the set of control parameters.

[0077] In some aspects, the one or more controllers may be configured to receive at least one of the specified performance level or the specified degradation level and determine, using the CGU configuration model, the set of control parameters of the plurality of control parameters associated with at least one of the specified performance level or the specified degradation level. In some aspects, the one or more controllers may be configured to receive the set of control parameters of the plurality of control parameters and determine, using the CGU configuration model, at least one of the specified performance level or the specified degradation level associated with the set of control parameters of the plurality of control parameters. In some aspects, the one or more controllers may be configured to receive an initial set of control parameters associated with a specific CGU, where the initial set of control parameters includes at least one an initial voltage or an initial current associated with the specific CGU, estimate a voltage distribution across the specific CGU based on the initial set of control parameters, determine, using the CGU configuration model, at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution across the specific CGU, and determine at least one of whether the initial performance level comprises an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for the specified performance level, or whether the initial degradation level comprises an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for the specified degradation level.

[0078] In some aspects, the one or more controllers may be configured to receive a plurality of input parameters associated with CGUs, identify the one or more reliability indices associated with the one or more control parameters of the plurality of control parameters in accordance with one or more input parameters of the plurality of input parameters, and generate the CGU configuration model of the series of relationships between performance and degradation of CGUs based on the one or more reliability indices and the one or more control parameters of the plurality of control parameters in accordance with at least one input parameter of the plurality of input parameters for specifying the set of control parameters of the plurality of control parameters according to at least one of the specified performance level or the specified degradation level. In some aspects, the one or more controllers may be configured to receive at least one of the specified performance level or the specified degradation level, receive one or more specified input parameters of the plurality of input parameters, and determine, using the CGU configuration model, the set of control parameters of the plurality of control parameters in accordance with the one or more specified input parameters and associated with at least one of the specified performance level or the specified degradation level. In some aspects, the one or more controllers may be configured to receive the set of control parameters of the plurality of control parameters, receive one or more specified input parameters of the plurality of input parameters, determine, using the CGU configuration model, at least one of the specified performance level or the specified degradation level in accordance with the one or more specified input parameters and associated with the set of control parameters of the plurality of control parameters. In some aspects, the one or more controllers may be configured to receive an initial set of control parameters associated with a specific CGU, wherein the initial set of control parameters comprises at least one an initial voltage or an initial current associated with the specific CGU, receive a set of input parameters associated with the specific CGU, wherein the set of input parameters comprises at least a physical dimension of the specific CGU, estimate a voltage distribution across the specific CGU based on the initial set of control parameters and the set of input parameters, determine, using the CGU configuration model, at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution across the specific CGU, and determine at least one of whether the initial performance level comprises an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for the specified performance level, or whether the initial degradation level comprises an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for the specified degradation level.

[0079] In some aspects, a computer implemented method for configuring coated glass units (CGUs) is provided. The method may include receiving a plurality of control parameters associated with CGUs. The method may also include identifying one or more reliability indices associated with one or more control parameters of the plurality of control parameters. The method may further include generating a CGU configuration model of a series of relationships between performance and degradation of CGUs based on the one or more reliability indices and at least one control parameter of the plurality of control parameters for specifying a set of control parameters of the plurality of control parameters according to at least one of a specified performance level or a specified degradation level. The specified performance level may include at least one of a specified steady state performance level or a specified transition performance level. In addition, the method may include tuning, based on the CGU configuration model, a CGU according to the set of control parameters. [0080] In some aspects, the method may include receiving at least one of the specified performance level or the specified degradation level and determining, using the CGU configuration model, the set of control parameters of the plurality of control parameters associated with at least one of the specified performance level or the specified degradation level. In some aspects, the method may include receiving the set of control parameters of the plurality of control parameters and determining, using the CGU configuration model, at least one of the specified performance level or the specified degradation level associated with the set of control parameters of the plurality of control parameters. In some aspects, the method may include receiving an initial set of control parameters associated with a specific CGU, wherein the initial set of control parameters comprises at least one an initial voltage or an initial current associated with the specific CGU, estimating a voltage distribution across the specific CGU based on the initial set of control parameters, determining, using the CGU configuration model, at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution across the specific CGU, and determining at least one of whether the initial performance level comprises an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for the specified performance level, or whether the initial degradation level comprises an inpane uniformity level of the specific CGU that is outside an in-pane uniformity level range for the specified degradation level.

[0081] In some aspects, the method may include receiving a plurality of input parameters associated with CGUs, identifying the one or more reliability indices associated with the one or more control parameters of the plurality of control parameters in accordance with one or more input parameters of the plurality of input parameters, and generating the CGU configuration model of the series of relationships between performance and degradation of CGUs based on the one or more reliability indices and the one or more control parameters of the plurality of control parameters in accordance with at least one input parameter of the plurality of input parameters for specifying the set of control parameters of the plurality of control parameters according to at least one of the specified performance level or the specified degradation level. In some aspects, the method may include receiving at least one of the specified performance level or the specified degradation level, receiving one or more specified input parameters of the plurality of input parameters, and determining, using the CGU configuration model, the set of control parameters of the plurality of control parameters in accordance with the one or more specified input parameters and associated with at least one of the specified performance level or the specified degradation level. In some aspects, the method may include receiving the set of control parameters of the plurality of control parameters, receiving one or more specified input parameters of the plurality of input parameters, and determining, using the CGU configuration model, at least one of the specified performance level or the specified degradation level in accordance with the one or more specified input parameters and associated with the set of control parameters of the plurality of control parameters. In some aspects, the method may include receiving an initial set of control parameters associated with a specific CGU, where the initial set of control parameters comprises at least one an initial voltage or an initial current associated with the specific CGU, receiving a set of input parameters associated with the specific CGU, where the set of input parameters comprises at least a physical dimension of the specific CGU, estimating a voltage distribution across the specific CGU based on the initial set of control parameters and the set of input parameters, determining, using the CGU configuration model, at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution across the specific CGU, and determining at least one of whether the initial performance level comprises an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for the specified performance level, or whether the initial degradation level comprises an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for the specified degradation level.

[0082] In some aspects, one or more non-transitory, computer-readable, storage media are provided. The one or more non-transitory, computer-readable, storage media may include program instructions that when executed on or across one or more processors cause the one or more processors to receive a plurality of control parameters associated with coated glass units (CGUs). The one or more non-transitory, computer-readable, storage media may include program instructions that when executed on or across one or more processors also cause the one or more processors to identify one or more reliability indices associated with one or more control parameters of the plurality of control parameters. The one or more non-transitory, computer- readable, storage media may include program instructions that when executed on or across one or more processors further cause the one or more processors to generate a CGU configuration model of a series of relationships between performance and degradation of CGUs based on the one or more reliability indices and at least one control parameter of the plurality of control parameters for specifying a set of control parameters of the plurality of control parameters according to at least one of a specified performance level or a specified degradation level. The specified performance level may include at least one of a specified steady state performance level or a specified transition performance level. In addition, the one or more non-transitory, computer-readable, storage media may include program instructions that when executed on or across one or more processors cause the one or more processors to tune, based on the CGU configuration model, a CGU according to the set of control parameters.

[0083] In some aspects, the one or more non-transitory, computer-readable, storage media may include program instructions that when executed on or across one or more processors cause the one or more processors to receive at least one of the specified performance level or the specified degradation level and determine, using the CGU configuration model, the set of control parameters of the plurality of control parameters associated with at least one of the specified performance level or the specified degradation level. In some aspects, the one or more non-transitory, computer- readable, storage media may include program instructions that when executed on or across one or more processors cause the one or more processors to receive the set of control parameters of the plurality of control parameters and determine, using the CGU configuration model, at least one of the specified performance level or the specified degradation level associated with the set of control parameters of the plurality of control parameters. In some aspects, the one or more non-transitory, computer-readable, storage media may include program instructions that when executed on or across one or more processors cause the one or more processors to receive a plurality of input parameters associated with CGUs, identify the one or more reliability indices associated with the one or more control parameters of the plurality of control parameters in accordance with one or more input parameters of the plurality of input parameters, and generate the CGU configuration model of the series of relationships between performance and degradation of CGUs based on the one or more reliability indices and the one or more control parameters of the plurality of control parameters in accordance with at least one input parameter of the plurality of input parameters for specifying the set of control parameters of the plurality of control parameters according to at least one of the specified performance level or the specified degradation level.

[0084] In some aspects, an electronic device is provided. The electronic device may include a memory. The electronic device may include one or more processors. The one or more processors may be configured to receive an initial set of control parameters associated with a specific coated glass unit (CGU), where the initial set of control parameters comprises at least one an initial voltage or an initial current associated with the specific CGU. The one or more processors may also be configured to estimate a voltage distribution across the specific CGU based on the initial set of control parameters. The one or more processors may further be configured to determine at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution. In addition, the one or more processors may be configured to determine at least one of whether the initial performance level comprises an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for a specified performance level, where the specified performance level includes at least one of a specified steady state performance level or a specified transition performance level, or whether the initial degradation level comprises an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for a specified degradation level. The one or more processors may be configured to initiate one or more repair or replacement operations for the specified CGU in response to determining at least one of that the initial performance level comprises the in-pane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level comprises the in-pane uniformity level of the specific CGU that is outside the in-pane uniformity level range for the specified degradation level.

[0085] In some aspects, the one or more controllers may be further configured to determine a specified set of control parameters for the specific CGU based on at least one of the initial performance level or the initial degradation level and in accordance with at least one of the specified performance level or the specified degradation level for the specific CGU, wherein the specified set of control parameters comprises at least one of a specified voltage for the specific CGU or a specified cunent for the specific CGU for improving voltage uniformity across the specific CGU. In some aspects, the initial performance level and the specific performance level may be associated with average tint levels of the specific CGU. In some aspects, the initial degradation level and the specific degradation level may be associated with in-pane uniformity of the specific CGU. In some aspects, the initial set of control parameters associated with the specific CGU may include at least one of tint holding control parameters or tint transitioning control parameters. In some aspects, the voltage distribution across the specific CGU may include an edge- to-center stack voltage distribution across the specific CGU.

[0086] In some aspects, a computer implemented method for assessing coated glass units (CGUs) is provided. The method may include receiving an initial set of control parameters associated with a specific CGU, where the initial set of control parameters may include at least one an initial voltage or an initial current associated with the specific CGU. The method may also include estimating a voltage distribution across the specific CGU based on the initial set of control parameters. The method may further include determining at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution. In addition, the method may include determining at least one of whether the initial performance level comprises an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for a specified performance level, where the specified performance level may include at least one of a specified steady state performance level or a specified transition performance level, or whether the initial degradation level comprises an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for a specified degradation level. The method may include initiating one or more repair or replacement operations for the specified CGU in response to determining at least one of that the initial performance level comprises the in-pane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level comprises the in-pane uniformity level of the specific CGU that is outside the in-pane uniformity level range for the specified degradation level.

[0087] In some aspects, the method may further include providing an indication for repair of the specific CGU or replacement of the specific CGU with anew CGU in response to determining at least one of that the initial performance level comprises the in-pane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level comprises the in-pane uniformity level of the specific CGU that is outside the in-pane uniformity level range for the specified degradation level. In some aspects, the method may further include determining a specified set of control parameters for the specific CGU based on at least one of the initial performance level or the initial degradation level and in accordance with at least one of the specified performance level or the specified degradation level for the specific CGU, wherein the specified set of control parameters comprises at least one of a specified voltage for the specific CGU or a specified current for the specific CGU for improving voltage uniformity across the specific CGU.

[0088] In some aspects, the initial performance level and the specific performance level may be associated with average tint levels of the specific CGU. In some aspects, the initial degradation level and the specific degradation level may be associated with in-pane uniformity of the specific CGU. In some aspects, the initial set of control parameters associated with the specific CGU may include at least one of tint holding control parameters or tint transitioning control parameters.

[0089] In some aspects, one or more non-transitory, computer-readable, storage media storing program instructions is provided. The program instructions when executed on or across one or more processors cause the one or more processors to receive an initial set of control parameters associated with a specific CGU, where the initial set of control parameters comprises at least one an initial voltage or an initial current associated with the specific CGU. The program instructions when executed on or across one or more processors also cause the one or more processors to estimate a voltage distribution across the specific CGU based on the initial set of control parameters. The program instructions when executed on or across one or more processors further cause the one or more processors to determine at least one of an initial performance level or an initial degradation level of the specific CGU based on the voltage distribution. In addition, the program instructions when executed on or across one or more processors cause the one or more processors to determine at least one of whether the initial performance level comprises an in-pane transmission level of the specific CGU that is outside an in-pane transmission level range for a specified performance level, where the specified performance level comprises at least one of a specified steady state performance level or a specified transition performance level, or whether the initial degradation level comprises an in-pane uniformity level of the specific CGU that is outside an in-pane uniformity level range for a specified degradation level. The program instructions when executed on or across one or more processors also cause the one or more processors to initiate one or more repair or replacement operations for the specified CGU in response to determining at least one of that the initial performance level comprises the in-pane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level comprises the in-pane uniformity level of the specific CGU that is outside the in-pane uniformity level range for the specified degradation level.

[0090] In some aspects, the program instructions when executed on or across the one or more processors may further cause the one or more processors to provide an indication for repair of the specific CGU or replacement of the specific CGU with a new CGU in response to determining at least one of that the initial performance level comprises the in-pane transmission level of the specific CGU that is outside the in-pane transmission level range for the specified performance level, or that the initial degradation level comprises the in-pane uniformity level of the specific CGU that is outside the in-pane uniformity level range for the specified degradation level. In some aspects, the program instructions when executed on or across the one or more processors further cause the one or more processors to determine a specified set of control parameters for the specific CGU based on at least one of the initial performance level or the initial degradation level and in accordance with at least one of the specified performance level or the specified degradation level for the specific CGU, wherein the specified set of control parameters comprises at least one of a specified voltage for the specific CGU or a specified current for the specific CGU for improving voltage uniformity across the specific CGU.

[0091] In some aspects, the initial performance level and the specific performance level may be associated with average tint levels of the specific CGU. In some aspects, the initial degradation level and the specific degradation level may be associated with in-pane uniformity of the specific CGU. In some aspects, the initial set of control parameters associated with the specific CGU may include at least one of tint holding control parameters or tint transitioning control parameters.

[0092] FIG. 16 illustrates an example computer system that may be used in some embodiments. The methods, features, mechanisms, techniques and/or functionality described herein may in various embodiments be implemented by any combination of hardware and software. For example, in one embodiment, the methods may be implemented by a computer system (e.g., a computer system as in FIG. 16) that includes one or more processors executing program instructions stored on a computer-readable storage medium coupled to the processors. The program instructions may implement the methods, features, mechanisms, techniques and/or functionality described herein. The various methods as illustrated in the figures and described herein represent example embodiments of methods. The order of any method may be changed, and various elements may be added, reordered, combined, omitted, modified, etc.

[0093] FIG. 16 is a block diagram illustrating a computer system according to some aspects, as well as various other systems, components, services or devices described herein. For example, computer system 1600 may implement a control unit configured to implement and/or utilize the features, methods, mechanisms and/or techniques described herein, in different embodiments. Computer system 1600 may be any of various types of devices, including, but not limited to, a personal computer system, desktop computer, laptop or notebook computer, mainframe computer system, handheld computer, workstation, network computer, a consumer device, application server, storage device, telephone, mobile telephone, or in general any type of computing device.

[0094] Computer system 1600 includes one or more processors 1610 (any of which may include multiple cores, which may be single or multi -threaded) coupled to a system memory 1620 via an input/output (I/O) interface 1630. Computer system 1600 further includes a network interface 1640 coupled to I/O interface 1630. In various embodiments, computer system 1600 may be a uniprocessor system including one processor 1610, or a multiprocessor system including several processors 1610 (e.g., two, four, eight, or another suitable number). Processors 1610 may be any suitable processors capable of executing instructions. For example, in various embodiments, processors 1610 may be general-purpose or embedded processors implementing any of a variety of instruction set architectures (ISAs), such as the x86, PowerPC, SPARC, or MIPS ISAs, or any other suitable ISA. In multiprocessor systems, each of processors 1610 may commonly, but not necessarily, implement the same ISA. The computer system 1600 also includes one or more network communication devices (e.g., network interface 1640) for communicating with other systems and/or components over a communications network (e.g., Internet, LAN, etc.). [0095] For example, a control unit may receive information and/or commands from one or more other devices requesting that one or more EC devices be changed to a different tint level using the systems, methods and/or techniques described herein. For instance, a user may request a tint change via a portable remote-control device (e.g., a remote control), a wall mounted (e.g., hard wired) device, or an application executing on any of various types of devices (e.g., a portable phone, smart phone, tablet and/or desktop computer are just a few examples).

[0096] In the illustrated embodiment, computer system 1600 is coupled to one or more portable storage devices 1680 via device interface 1670. In various embodiments, portable storage devices 1680 may correspond to disk drives, tape drives, solid state memory, other storage devices, or any other persistent storage device. Computer system 1600 (or a distributed application or operating system operating thereon) may store instructions and/or data in portable storage devices 1680, as desired, and may retrieve the stored instruction and/or data as needed. In some embodiments, portable device(s) 1680 may store information regarding one or EC devices, such as information regarding design parameters, etc. usable by control unit 320 when changing tint levels using the techniques described herein.

[0097] Computer system 1600 includes one or more system memories 1620 that can store instructions and data accessible by processor(s) 1610. In various embodiments, system memories 1620 may be implemented using any suitable memory technology, (e.g., one or more of cache, static random-access memory (SRAM), DRAM, RDRAM, EDO RAM, DDR 10 RAM, synchronous dynamic RAM (SDRAM), Rambus RAM, EEPROM, non-volatile/Flash-type memory, or any other type of memory). System memory 1620 may contain program instructions 1625 that are executable by processor(s) 1610 to implement the methods and techniques described herein. In various embodiments, program instructions 1625 may be encoded in platform native binary, any interpreted language such as Java™ bytecode, or in any other language such as C/C++, Java™, etc., or in any combination thereof. For example, in the illustrated embodiment, program instructions 1625 include program instructions executable to implement the functionality of a control unit, a stack voltage measurement module, an ESR module, an OCV module, a supervisory control system, local controller, project database, etc., in different embodiments In some embodiments, program instructions 1625 may implement a control unit configured to implement and/or utilize the features, methods, mechanisms and/or techniques described herein, and/or other components.

[0098] In some embodiments, program instructions 1625 may include instructions executable to implement an operating system (not shown), which may be any of various operating systems, such as UNIX, LINUX, Solaris™, MacOS™, Windows™, etc. Any or all of program instructions 1625 may be provided as a computer program product, or software, that may include a non- transitory computer-readable storage medium having stored thereon instructions, which may be used to program a computer system (or other electronic devices) to perform a process according to various embodiments. A non-transitory computer-readable storage medium may include any mechanism for storing information in a form (e.g., software, processing application) readable by a machine (e.g., a computer). Generally speaking, a non-transitory computer-accessible medium may include computer-readable storage media or memory media such as magnetic or optical media, e.g., disk or DVD/CD-ROM coupled to computer system 1600 via I/O interface 1630. A non-transitory computer-readable storage medium may also include any volatile or non-volatile media such as RAM (e g , SDRAM, DDR SDRAM, RDRAM, SRAM, etc ), ROM, etc., that may be included in some embodiments of computer system 1600 as system memory 1620 or another type of memory. In other embodiments, program instructions may be communicated using optical, acoustical or other form of propagated signal (e.g., carrier waves, infrared signals, digital signals, etc.) conveyed via a communication medium such as a network and/or a wireless link, such as may be implemented via network interface 1640.

[0099] In one embodiment, I/O interface 1630 may coordinate I/O traffic between processor 1610, system memory 1620 and any peripheral devices in the system, including through network interface 1640 or other peripheral interfaces, such as device interface 1670. In some embodiments, I/O interface 1630 may perform any necessary protocol, timing or other data transformations to convert data signals from one component (e.g., system memory 1620) into a format suitable for use by another component (e.g., processor 1610). In some embodiments, I/O interface 1630 may include support for devices attached through various types of peripheral buses, such as a variant of the Peripheral Component Interconnect (PCI) bus standard or the Universal Serial Bus (USB) standard, for example. In some embodiments, the function of I/O interface 1630 may be split into two or more separate components, such as a north bridge and a south bridge, for example. Also, in some embodiments, some or all of the functionality of I/O interface 1630, such as an interface to system memory 1620, may be incorporated directly into processor 1610.

[00100] Network interface 1 40 may allow data to be exchanged between computer system 1600 and other devices attached to a network, such as other computer systems 1660. In addition, network interface 1640 may allow communication between computer system 1600 and various I/O devices and/or remote storage devices. Input/output devices may, in some embodiments, include one or more display terminals, keyboards, keypads, touchpads, scanning devices, voice or optical recognition devices, or any other devices suitable for entering or retrieving data by one or more computer systems 1600. Multiple input/output devices may be present in computer system 1600 or may be distributed on various nodes of a distributed system that includes computer system 1600. In some embodiments, similar input/output devices may be separate from computer system 1600 and may interact with one or more nodes of a distributed system that includes computer system 1600 through a wired or wireless connection, such as over network interface 1640. Network interface 1640 may commonly support one or more wireless networking protocols (e.g., Wi- Fi/IEEE 802.11, or another wireless networking standard). However, in various embodiments, network interface 1640 may support communication via any suitable wired or wireless general data networks, such as other types of Ethernet networks, for example. Additionally, network interface 1640 may support communication via telecommunications/tel ephony networks such as analog voice networks or digital fiber communications networks, via storage area networks such as Fibre Channel SANs, or via any other suitable type of network and/or protocol. In various embodiments, computer system 1600 may include more, fewer, or different components than those illustrated in FIG. 16 (e.g., displays, video cards, audio cards, peripheral devices, other network interfaces such as an ATM interface, an Ethernet interface, a Frame Relay interface, etc.) [00101] The various methods as illustrated in the figures and described herein represent example embodiments of methods. The methods may be implemented manually, in software, in hardware, or in a combination thereof. The order of any method may be changed, and various elements may be added, reordered, combined, omitted, modified, etc.

[00102] Although the embodiments above have been described in considerable detail, numerous variations and modifications may be made as would become apparent to those skilled in the art once the above disclosure is fully appreciated. It is intended that the following claims be interpreted to embrace all such modifications and changes and, accordingly, the above description to be regarded in an illustrative rather than a restrictive sense.