Title:
WAVEFORM ANALYSIS METHOD AND WAVEFORM ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/064924
Kind Code:
A1
Abstract:
Provided is a waveform analysis device (4) for analyzing a target waveform that is a chromatogram or a spectroscopic spectrum, a waveform dividing unit (54) which divides the target waveform into a plurality of partial waveforms; a determination unit (55) which uses a learned model created by machine learning using a plurality of sets of a plurality of partial waveforms created by dividing a reference waveform for which the position of the peak portion is known and determines whether or not each of the plurality of partial waveforms of the target waveform is a peak portion; and a classification unit (56) which, on the basis of the determination result by the determination unit, classifies the target waveform into a peak region in which peak portions are continuous and a non-peak region other than the peak region.
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Inventors:
KANAZAWA SHINJI (JP)
Application Number:
PCT/JP2019/039018
Publication Date:
April 08, 2021
Filing Date:
October 02, 2019
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N27/62; G01N3/00; G01N21/64; G01N23/2273; G01N30/86; H01J49/26
Domestic Patent References:
WO2019092837A1 | 2019-05-16 |
Foreign References:
JP2014134385A | 2014-07-24 | |||
JP2016028229A | 2016-02-25 | |||
JP2010520471A | 2010-06-10 | |||
JPH02297060A | 1990-12-07 |
Attorney, Agent or Firm:
KYOTO INTERNATIONAL PATENT LAW OFFICE (JP)
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