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Title:
WAVELENGTH-SCANNING-BASED LENSLESS FOURIER PTYCHOGRAPHIC DIFFRACTION TOMOGRAPHY MICROIMAGING METHOD
Document Type and Number:
WIPO Patent Application WO/2024/016774
Kind Code:
A1
Abstract:
A wavelength-scanning-based lensless Fourier ptychographic diffraction tomography microimaging method, comprising: on a lensless on-chip microscopic experiment system, performing illumination merely by using a wavelength-tunable light source, and collecting a series of in-line holograms; and then filling a three-dimensional scattering potential spectrum by means of an iterative Fourier ptychographic method to directly restore a three-dimensional refractive index distribution of a sample. There is no need to perform complicated transformation on a traditional lensless on-chip microscope, and pixels of the lensless on-chip microscope can be endowed with the super-resolution three-dimensional tomography capability.

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Inventors:
ZUO CHAO (CN)
CHEN QIAN (CN)
SUN JIASONG (CN)
FENG SHIJIE (CN)
ZHANG YUZHEN (CN)
WU XUEJUAN (CN)
Application Number:
PCT/CN2023/091011
Publication Date:
January 25, 2024
Filing Date:
April 27, 2023
Export Citation:
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Assignee:
UNIV NANJING SCI & TECH (CN)
International Classes:
G01N21/41; G06F17/14
Foreign References:
CN115144371A2022-10-04
CN108169173A2018-06-15
CN105182514A2015-12-23
CN105158894A2015-12-16
CN106768280A2017-05-31
CN112327473A2021-02-05
US20080137933A12008-06-12
US20210372916A12021-12-02
Attorney, Agent or Firm:
GRANDALL (NANJING) LAW FIRM (CN)
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