Title:
X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2022/065110
Kind Code:
A1
Abstract:
The present invention provides an X-ray inspection device comprising an X-ray generator (21), an X-ray detector (24), and a determination unit (33) which determines the state of quality of an inspection target (W) on the basis of an X-ray detection signal, said X-ray inspection device comprising: an X-ray image storage unit (31) which stores a first X-ray image (Pe) corresponding to an X-ray detection signal for each transmission area; a pseudo 3D information generation model (41) which generates pseudo 3D information relating to a breed under study; an inspection image generation unit (42) which, on the basis of the first inspection image (Pe) relating to the breed under study, uses the pseudo 3D information to create a pseudo second inspection image (Ps1, Ps2) in which the direction of observation differs from that in the first inspection image (Pe), wherein the determination unit (33) makes a determination on the basis of at least the second inspection image (Ps1, Ps2) created by the inspection image generation unit (42).
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Inventors:
ISHIDA MASARU (JP)
Application Number:
PCT/JP2021/033560
Publication Date:
March 31, 2022
Filing Date:
September 13, 2021
Export Citation:
Assignee:
ANRITSU CORP (JP)
International Classes:
G01N23/18
Foreign References:
| JP2019023664A | 2019-02-14 | |||
| JP2002189002A | 2002-07-05 | |||
| JP6537008B1 | 2019-07-03 | |||
| JP2004340606A | 2004-12-02 | |||
| US20100290582A1 | 2010-11-18 | |||
| JP2009192519A | 2009-08-27 | |||
| JP2002168802A | 2002-06-14 |
Attorney, Agent or Firm:
ARIGA, Eiichiro et al. (JP)
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