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Title:
X-RAY SOURCE ASSEMBLY HAVING ENHANCED OUTPUT STABILITY, AND FLUID STREAM ANALYSIS APPLICATIONS THEREOF
Document Type and Number:
WIPO Patent Application WO2003049510
Kind Code:
A3
Abstract:
An x-ray source assembly (2700) and method of operation are provided having enhanced output stability. The assembly includes an anode (2125) having source spot upon which electrons (2120) impinge and a control system (2715/2720) for controlling position of the anode source spot relative to an output structure. The control system can maintain the anode source spot location relative to the output structure (2710) notwithstanding a change in one or more operating conditions of the x-ray source assembly. One aspect of the disclosed invention is most amenable to the analysis of sulfur in petroleum-based fuels.

Inventors:
RADLEY IAN (US)
BIEVENUE THOMAS J (US)
BURDETT JOHN H JR (US)
GALLAGHER BRIAN W (US)
SHAKSHOBER STUART M (US)
CHEN ZEWU (US)
MOORE MICHAEL D (US)
Application Number:
PCT/US2002/038493
Publication Date:
January 22, 2004
Filing Date:
December 04, 2002
Export Citation:
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Assignee:
X RAY OPTICAL SYS INC (US)
RADLEY IAN (US)
BIEVENUE THOMAS J (US)
BURDETT JOHN H JR (US)
GALLAGHER BRIAN W (US)
SHAKSHOBER STUART M (US)
CHEN ZEWU (US)
MOORE MICHAEL D (US)
International Classes:
G01N23/12; G01N23/223; G21K1/00; G21K5/02; G21K5/08; H01J35/12; H05G1/00; (IPC1-7): H05G1/04; G01N23/223
Domestic Patent References:
WO2001002842A22001-01-11
Foreign References:
US2831977A1958-04-22
DE19540195A11997-05-07
US2121630A1938-06-21
US5778039A1998-07-07
US4674109A1987-06-16
US4837792A1989-06-06
Other References:
PATENT ABSTRACTS OF JAPAN vol. 018, no. 157 (C - 1180) 16 March 1994 (1994-03-16)
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