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JP4763683B2 |
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JP4761051B2 |
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JP2011164378A |
To provide a drawing control device that achieves high-speed drawing and a waveform measuring device using the drawing control device.The drawing control device uses a graphic display control section including a drawing data memory stori...
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JP4756904B2 |
To measure a steep signal waveform such as a lightning surge by a simple structure with high precision. A lightning surge current discharged from a protective device 3 to a grounding wire 4 when a lightning surge is applied is detected b...
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JP4756347B2 |
To achieve a waveform measuring device capable of certainly capturing an abnormal waveform. The waveform measuring device having a determining means for determining whether measured waveform establishes a determination condition is impro...
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JP4754910B2 |
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JP2011523706A |
A method for automated searching of signal characteristics represented in a bitmap of an RF test and measurement device is provided. The bitmap is populated via sampling of a time-varying signal, where a first signal characteristic is re...
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JP4747861B2 |
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JP4752424B2 |
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JP2011153835A |
To provide a waveform display device allowing an operator to clearly recognize the transition into a history mode and contents of a history function so that the history function is easily used.In the waveform display device having a hist...
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JP4743519B2 |
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JP4740919B2 |
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JP4741224B2 |
To provide a waveform display device which is improved against degradation in quality of waveform display and displaying the waveform more smoothly in the range where the sampling frequency is relatively low, and also improved in recogni...
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JP2011145964A |
To provide a measuring apparatus that secures the recognition of the switching of a setting screen, and a method of displaying a setting screen.While a designated screen out of a plurality of setting screens that differ in at least eithe...
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JP2011145239A |
To display easily in a short time, an optional signal waveform by a waveform expansion/contraction operation.In a waveform expansion/contraction processing 50 for displaying a signal waveform on a waveform display domain, and expanding o...
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JP4729596B2 |
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JP4729273B2 |
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JP4722953B2 |
A system is disclosed for equalizing the distribution of pixel intensities in an image displayed by an oscilloscope. In a primarily software implementation, the maximum pixel intensity (I) present in the rasterized input image, the maxim...
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JP4707957B2 |
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JP4709239B2 |
A system is disclosed for equalizing the distribution of pixel intensities in an image displayed by an oscilloscope. In a primarily software implementation, the maximum pixel intensity (I) present in the rasterized input image, the maxim...
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JP4702726B2 |
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JP2011106854A |
To promptly set a setting content concerning measurement processing and display processing.This measuring instrument includes a measurement processing part for carrying out the measurement processing; a display processing part for perfor...
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JP2011106946A |
To easily perform scrolling, and enlarging or reducing of a signal waveform.The signal waveform W is displayed in a waveform display area 11 by assigning time axis to the direction of arrow A and by assigning signal level to the directio...
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JP2011102755A |
To attain a waveform data display device which enables a reduction in frequency of readout of display data from a video memory and shortening of a processing time for a waveform display.The waveform data display device includes a display...
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JP4686272B2 |
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JP4686000B2 |
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JP2011095218A |
To achieve a probe head having improved stability and reproducibility of measurement.The probe head includes: a vessel having holes formed in a truncated chevron shape with a predetermined angle on a bottom; a partition for two-dividing ...
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JP2011095080A |
To provide a data collecting device for writing measurement data into and reading measurement data out of a data storage memory by the ring buffer system, capable of continuing collection of the measurement data and preventing the loss o...
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JP2011089832A |
To properly correct jitter without being affected by a trigger delay even if the jitter is present in a signal to be measured and a synchronized clock signal of a device to be measured.A sampling device includes: a functional part for ge...
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JP2011085408A |
To actualize a waveform display for executing processing at a relatively high speed when displaying accumulated waveforms corresponding to one image plane.In this waveform display, a multitude of waveform data are captured in the respect...
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JP4677574B2 |
An acquisition apparatus for a test and measurement instrument includes an input to receive an input signal, a digitizer to digitize a selected signal, a bypass path to selectively couple the input to the digitizer, a frequency shift pat...
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JP4665955B2 |
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JP4659190B2 |
A reference signal generation portion (14) generates a reference signal independently of a repetition cycle of a signal under test. A frequency measuring portion (15) measures the repetition frequency of the signal under test by using a ...
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JP2011058816A |
To provide a measurement apparatus capable of causing different data display forms to coexist in each of a plurality of measurement channels on a common display screen with comparatively simple operation.In the measurement apparatus conf...
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JP4657483B2 |
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JP4658001B2 |
A simple, integrated control (12) for pan and zoom of a display of data represented by a very long data record is in the form of a control knob (10) having an outer ring (14) for controlling pan and an inner knob (16) for controlling a z...
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JP4655608B2 |
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JP4655831B2 |
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JP4657877B2 |
A method of characterizing a newly acquired waveform with respect to previously acquired waveforms during monitoring of a generally repetitive signal, where the previously acquired waveforms have been rasterized into a two-dimensional ar...
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JP4650790B2 |
A sampling device for repetitive sampling a measured signal includes a measured signal sampling circuit for sampling the measured signal, a reference signal generating circuit for generating a reference signal having a predetermined freq...
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JP4647759B2 |
A common reference signal is applied from the same reference signal generating portion (14) to a reference signal input terminal (REF1) of a signal under test generator (11) and a reference signal input terminal (REF2) of a sampling sign...
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JP4649397B2 |
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JP2011043373A |
To provide a waveform measuring device with its measurement accuracy enhanced for measuring a transient response, irregular waveform fluctuation, or the like, in a discrete element.The waveform measuring device includes: a voltage measur...
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JP4634120B2 |
To provide a waveform display capable of discriminating the quality level of the input signal. The display comprises a measuring section measuring the input signal with a specific period and outputting the measured values, a first memory...
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JP4634137B2 |
To provide a waveform determining apparatus which can perform appropriate pass/fail decision on a signal waveform, even if there is superposition of noise on the signal waveform or if there are slight fluctuations in the signal waveform....
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JP4634139B2 |
To provide a waveform determining apparatus which can provide an accurate and quick understanding of factors for a faulty waveform, with respect to an input signal. The waveform decision apparatus comprises a measurement section for meas...
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JP2011027729A |
To perform a plurality of measurements with a real time oscilloscope.Required setting of the oscilloscope is performed, and a 10GBASE-T signal is taken (step 10). Spectrum analysis of a waveform is performed, but two peak values of tone ...
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JP4629542B2 |
The present invention provides a burst noise canceling apparatus which can remove burst noises even in a one-time data, without the need of a large amount of memory. The device according to the present invention incorporates an analog-to...
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JP2011022109A |
To provide an apparatus and method for displaying waveforms, capable of effectively identifying waveforms indicating test results on a display screen.An operation accepting means 14 accepts scroll operation on the display screen 2 and op...
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JP4625975B2 |
A method of creation/editing masks/waveforms for an instrument invokes a mask editor from an application running on the instrument. A context or signal waveform displayed in the application is transferred as a reference to a mask editor ...
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