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JP4204954B2 |
A signal acquisition instrument (600), such as an oscilloscope, having an input stage (606) that is referenced to a user's ground (609) is disclosed. Information gathered by the input stage is stored in a storage element (610) powered by...
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JP4201997B2 |
An oscilloscope that is capable of displaying simultaneously multiple waveforms representing time evolution of a signal during respective acquisition intervals acquires waveform data using a first set of acquisition parameters and genera...
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JP2008299614A |
To provide a waveform display method, for reducing the time for displaying simulation waveform or the like of each part obtained in designing a semiconductor integrated circuit on a display device.The waveform display method for displayi...
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JP2008298525A |
To provide a simple waveform abnormality detector for preventing an erroneous abnormality determination even if a signal waveform to be monitored rapidly rises or falls when there are a time error and a peak value error between a referen...
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JP4188684B2 |
A method and apparatus for governing the internal operation of an instrument. The apparatus comprises device for storing a value, device for changing the value and a device for attaching to another item that need to be notified of a chan...
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JP4179537B2 |
A method and apparatus for governing the internal operation of an instrument. The apparatus comprises device for storing a value, device for changing the value and a device for attaching to another item that need to be notified of a chan...
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JP4180360B2 |
A multi-channel, low input capacitance signal probe head has a housing (50) that receives one or more substrates (58) having input signal pads (56) exposed on one end of the substrate. The substrate is positioned in the housing such that...
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JP2008267882A |
To provide sampling with digital data signal improved.A signal analyzer determining property of data signal (D1) which has a bit sequence of a plurality of bits comprises a first sampling circuit (30), in response to first trigger signal...
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JP4167937B2 |
A dual timebase feature for digital storage oscilloscope includes an A/D converter (400) for producing digital samples of a signal under test. The digital samples are applied to a first decimator (410) for decimating the samples. A secon...
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JP2008250442A |
To correctly generate a trigger signal to be used externally for debugging of a communication function in a microcontroller at a desired timing.A trigger generation circuit is composed of a counter, a plurality of count frequency holding...
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JP4166185B2 |
To secure a reset action of a circuit by enabling waveform shaping of a pulse current. A Josephson junction J2 is provided for ejecting the second circulation current between a pulse generating circuit that generates a first circulation ...
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JP4164148B2 |
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JP2008232968A |
To readily specify which part of a signal to be measured, as a part of problem section within an eye pattern, corresponds to.An eye pattern generated from sample data of a measured signal for expressing frequency information using colors...
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JP4156941B2 |
To provide an interchannel skew correction system for a plurality of sampling digitizers capable of correcting at any time an interchannel skew between the plurality of the sampling digitizers in a state of being assembled into a system....
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JP4156826B2 |
The invention involves storing information about the probe frequency response in the probe itself. The information preferably consists of a set of one or more characteristic frequency response data points. Each data point includes at lea...
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JP2008215831A |
To appropriately and easily control electronic apparatuses having characteristics that the relation between input signals and output signals is, for example, nonlinear.A signal processing apparatus (100) is provided with: a first acquisi...
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JP4147451B2 |
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JP2008197106A |
To show a plurality of data channels collected as a group, to indicate which group is selected, and to indicate a channel in the group.This test and measurement instrument for receiving and displaying the plurality of data channels shows...
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JP2008197105A |
To easily and conveniently arrange the displays of a plurality of data channels of a measuring instrument in a desired group.For automatically forming a group of the plurality of data channels, a channel for display is selected from the ...
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JP4135953B2 |
A waveform measuring apparatus includes: a digital filter for removing a large-amplitude changing component from an input signal and for outputting a resultant output signal with a small-amplitude noise component left therein; a window g...
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JP4135055B2 |
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JP2008180615A |
To provide an observation display device for generating thinning-out data having high utility values by thinning sample points at regular intervals.A digital oscilloscope 100 divides observation data at each prescribed several-n piece se...
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JP4129160B2 |
A test and measurement instrument such as a Logic Analyzer, or the like, has at least one Reloadable Word Recognizer whose reference value can be loaded by a trigger machine with a current acquired data sample while data is being acquire...
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JP4127895B2 |
To simply, accurately and clearly regulate a sensitivity of what degree of an amplitude of a detected surge voltage a display is operated by selecting a fixed resistance of a different value by a changeover switch and regulating it. An e...
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JP4128755B2 |
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JP2008170264A |
To provide a measuring instrument and a measuring method wherein the measuring instrument is operated by a user alone even if both his/her hands are occupied.This measuring instrument for measuring the physical properties of a measuring ...
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JP2008170163A |
To provide an observation display system capable of moving waveform images acquired by observation through easy operations.A digital sampling oscilloscope is provided with a data processing circuit 108 for acquiring observation data by s...
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JP4122787B2 |
To provide an electronic image converter in which only an intrinsic signal waveform is made clear for observation by suppressing multiple irregular reflections of incident light to prevent the peripheral light of an observed signal wavef...
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JP2008157971A |
To provide a sampling timing signal generator that has an operation noise smaller than that of prior art and is suitable for an on-chip signal waveform measurement apparatus.A sampling timing signal generator includes: a replica DLL circ...
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JP4115282B2 |
A deskew fixture has a multilayer circuit board from which pairs of mirrored signal launch contact extend from both sides of the circuit board. One pair of contacts is coupled to electrical ground and the other pair is connected via equa...
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JP4115908B2 |
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JP2008151620A |
To provide a waveform measuring device and a waveform measuring method capable of performing easily output of a test signal to a system to be measured, and measurement of a signal to be measured from the system to be measured, or the lik...
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JP4109140B2 |
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JP4106584B2 |
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JP4107612B2 |
An observation apparatus which observers operations of an observation target apparatus, and which includes: an output signal acquisition unit for sequentially acquiring signal values by observing signals outputted by the observation targ...
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JP2008521014A |
In a preferred embodiment, methods for improving oscilloscope bandwidth involve the use of frequency up-conversion and down-conversion techniques to obtain system bandwidth that significantly exceeds the bandwidth achievable by interleav...
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JP2008139180A |
To specify a transmission original node of an abnormal waveform out of each node connected to a serial bus network.A serial signal input to an oscilloscope 20A is amplified or attenuated in an input amplifier 40, and converted into quant...
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JP4102214B2 |
A system is disclosed for equalizing the distribution of pixel intensities in an image displayed by an oscilloscope. In a primarily software implementation, the maximum pixel intensity (I) present in the rasterized input image, the maxim...
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JP4104468B2 |
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JP4102595B2 |
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JP4103134B2 |
The object of the present invention is to realize waveform display equipment and to achieve a waveform displaying method, in which a plurality of waveforms can be easily observed and measured. The present invention improves conventional ...
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JP4099002B2 |
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JP4098861B2 |
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JP4098885B2 |
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JP2008128736A |
To overcome the problem wherein analysis of tendency in the measured physical quantity and detail reading of the current physical quantity cannot be implemented simultaneously, since adjacent waveforms displayed on a display are mixed.A ...
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JP2008122195A |
To provide a sampler with a large maximum input amplitude or with a large bandwidth.The sampler having a transmission line for transmitting a step-like strobe signal generates an impulse-like differential signal by reflecting the strobe ...
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JP4090611B2 |
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JP4090574B2 |
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JP4089953B2 |
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JP4085602B2 |
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