To provide a characteristics evaluation circuit and an evaluation method for a transistor, capable of analyzing dispersions in the characteristics of the plurality of transistors.
This characteristics evaluation device for the transistor has a plurality of unit circuits 10, including the transistor 1 of a measuring object with a gate connected to an output terminal of a two-input NAND circuit 2 via an inverter 3, with a drain connected to a column electric power source 11, and with a source connected to a row electric power source 12. The characteristics evaluation device has further an inverter as a voltage detector, wherein a column driver circuit 22 is connected to the row electric power source 12, wherein a row driver circuit 21 is connected to the column electric power source 11, and connected to the column electric power source 11, and an output terminal 24 for receiving an output signal OUTC from the each inverter 23.
| JP2004257813 | MEASURING DEVICE |
| JPS6484923 | SYSTEM FOR TESTING DECODER |
| JP2008064512 | SEMICONDUCTOR DEVICE AND ITS INSPECTION METHOD |
Hiroshi Koyama
Hiroshi Takeuchi
Takahisa Shimada
Yuji Takeuchi
Katsumi Imae
Atsushi Fujita
Kazunari Ninomiya
Tomoo Harada
Iseki Katsumori