To provide an infrared camera adjustment method that adjusts parameters in an infrared camera or parameters between cameras indicating a relationship among a plurality of infrared cameras, or can be used effectively when measuring both of them simultaneously.
In a target board 1, a radiation surface 1a made of a radiation material having a reflection factor of middle- to far-infrared rays of less than 50% and a reflection surface 1b, namely a smooth surface made of a reflection material having a reflection factor of middle- to far-infrared rays of not less than 50% are present on a surface section. By using the target board 1, where the two surfaces 1a, 1b are disposed in a prescribed pattern configuration, the target board 1 is disposed in an angle of view of the infrared camera 3, an upper part of a horizontal line is reflected and no objects on the ground are reflected on the reflection surface 1b photographed by the infrared camera 3, and the position or direction of the infrared camera 3 is adjusted, based on the prescribed pattern on the target board 1 photographed by the infrared camera 3.
KUMAKURA HIROTAKA
IHI AEROSPACE CO LTD
| JP2005345950A | 2005-12-15 | |||
| JP2000348282A | 2000-12-15 | |||
| JPH09166494A | 1997-06-24 | |||
| JPH02217817A | 1990-08-30 | |||
| JP2006153777A | 2006-06-15 | |||
| JP2005345950A | 2005-12-15 | |||
| JP2000348282A | 2000-12-15 | |||
| JPH09166494A | 1997-06-24 |
Iwa Saki Kokuni
Kawamata Sumio
Masakazu Ito
Shunichi Takahashi
Toshio Takamatsu