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Patent Searching and Data


Title:
MEASURING DEVICE AND MEASURING METHOD FOR MINUTE PARTICLE GROUP
Document Type and Number:
Japanese Patent JP2003106980
Kind Code:
A
Abstract:

To provide a device and method capable of measuring a particle diameter distribution and a concentration distribution of particles even when a particle diameter is large.

In a particle diameter measuring device using a laser diffraction method, spatial resolution of interference fringe measurement is enhanced by using a CCD element 6a as a detector for acquiring an interference fringe, and an interference fringe in a dynamic range of the CCD element 6a can be measured by providing a 0-order diffracted light shielding plate 5 between a Fourier transform lens 3 and the CCD element 6a. By providing an ND filter 4 decaying laser beam intensity between the Fourier transform lens 3 and the 0-order diffracted light shielding plate 5, interference between a CCD element 7 face and its protective film is eliminated.


Inventors:
YAMAGATA SHINJI
MIHASHI HIDEO
OKAWA KATSUHISA
Application Number:
JP2001304790A
Publication Date:
April 09, 2003
Filing Date:
October 01, 2001
Export Citation:
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Assignee:
NEC CORP
International Classes:
G01N15/02; (IPC1-7): G01N15/02
Attorney, Agent or Firm:
Yusuke Omi