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Title:
METHOD AND APPARATUS FOR MEASURING WAVEFORM OF LIGHT SIGNAL
Document Type and Number:
Japanese Patent JP3895560
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To make faithfully observable the waveform of a light signal to be measured with high time resolution in a measuring apparatus and method of the waveform of a light signal.
SOLUTION: A nonlinear light loop mirror provided with a first light coupler including first and second light paths that are coupled in terms of direction, a loop light path comprising a nonlinear optical medium for connecting the first and second light paths, and a second light coupler including a third light path that is subjected to directional coupling to the loop light path, is provided. A light signal whose waveform to be measured is supplied from the first light path to the nonlinear loop mirror. A light trigger having a predetermined pulse width is supplied from the third light path to the nonlinear light loop mirror. Information on the waveform of the light signal is obtained based on light that is outputted from the second light path. The predetermined pulse width is set according to required measurement accuracy. Since the pulse width of the light trigger is set according to the required measurement accuracy by the method, faithful observation of the waveform of the light signal to be measured is made possible with high time resolution.


Inventors:
Fumio Futami
Shigeki Watanabe
Application Number:
JP2001199203A
Publication Date:
March 22, 2007
Filing Date:
June 29, 2001
Export Citation:
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Assignee:
富士通株式会社
International Classes:
G01J11/00; G02F1/365; H04B10/07; H04B10/25; G02F1/35; (IPC1-7): G01J11/00; G02F1/365; H04B10/08
Domestic Patent References:
JP8146473A
JP2003090766A
JP11223575A
Foreign References:
WO1993003406A1
Other References:
電子情報通信学会技術研究報告,(社)電子情報通信学会,2000年 2月 4日,Vol.99 No.605,p.55~60
IEEE Electronics Letters ,1991年 1月31日,Vol.27 No.3,p.204~205
Attorney, Agent or Firm:
Akira Matsumoto