METHOD FOR MEASURING ORGANIZATION CHARACTERISTIC BY FLUORESCENCE

Japanese Patent JP3497854

B2

PROBLEM TO BE SOLVED: To obtain the maximum contrast when detecting fluorescence in a method for measuring organization characteristics with induced fluorescence.
SOLUTION: A fluorescence-imaging apparatus for measuring organization characteristics under the presence of interfering absorption substances comprises an irradiation source for generating light with a narrow wavelength band, a detector that detects fluorescence from a sample that is illuminated by an illumination source at least at two predetermined spectrum intervals for obtaining at least two fluorescence intensity values while the center of at least two predetermined spectrum intervals is located at the center of a wavelength on a pair of wavelength values having essentially equal absorption values in the absorption substance, and an arithmetic/logic means for performing an operation including at least one division operation to at least two fluorescence intensity values for obtaining a characteristic numerical value to the organization characteristics of the sample.

JP2024036267	endoscope system
JP2911051	INDUSTRIAL APPLICABILITY: Curved portion drive control device
JPH09201329	AUTOMATED GONIOMETER MECHANISM

Stephan Anderson-Engels
Gionas Johansson
Une Stenram
Katarina Suvuanberg
Sne Svemberberg

JP2002222126A

February 16, 2004

February 21, 1990

Click for automatic bibliography generation  

Spectrahus AB

A61B1/00; A61B5/00; A61B5/145; A61B5/1455; A61B5/1495; A61B10/00; G01N21/64; G01N21/31; (IPC1-7): G01N21/64; A61B1/00

JP62247232A
JP61257638A
JP6238346A
JP6332356A
JP61266942A
JP5241581A
JP8178849A
JP58118948A
JP5342790A
JP62500803A
JP11500832A

Shusaku Yamamoto (2 outside)

Previous Patent: SEMICONDUCTOR DEVICE AND SEMICONDUCTOR INTEGRATED CIRCUIT

Next Patent: DUPLEX SYSTEM DEVICE