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Title:
WAFER RETAINER, WAFER RETAINING AND WAFER CLEANING METHOD
Document Type and Number:
Japanese Patent JPH11288910
Kind Code:
A
Abstract:

To smoothly deliver wafers into a cleaning bath from a conveying chuck, and to prevent the wafer-to-wafer interference in the cleaning bath, by a method wherein the opening angle of the first stage V-groove, on the opening side of a wafer retaining groove, is set larger, and the opening angle of the second V-groove on the bottom side is set smaller.

The section shape of the wafer retaining groove 16 of a wafer retainer 12 is formed into two-stage groove. More specifically the wafer retaining groove 16 has the first stage V-groove 18 on the opening side and the second stage V-groove 20 on the bottom side. As the opening angle α of the first stage V-groove 18 is wide, a cleaning liquid can be taken in and out to and from the first stage V-groove 18 in the state, in which the wafer W is retained in the second stage V-groove 20. Accordingly, the pressure of the first stage V-groove 18 does not in the least become a barrier even when it is considered from the view point of cleaning effect. If the edge is rounded on the connection part 24 between the first stage V-groove 18 and the surface of the wafer retaining main body 14 and on the connection part between the first stage V-groove and the second stage V-groove 20, the wafer W can be inserted smoothly.


Inventors:
TOMARU SHINICHI
MARUYAMA FUMIAKI
EBARA YOSHIJI
Application Number:
JP9188598A
Publication Date:
October 19, 1999
Filing Date:
April 03, 1998
Export Citation:
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Assignee:
MIMASU SEMICONDUCTOR IND CO
International Classes:
H01L21/683; H01L21/304; H01L21/68; (IPC1-7): H01L21/304; H01L21/68
Attorney, Agent or Firm:
Shoji Ishihara