Title:
TIME-OF-FLIGHT MASS SPECTROMETER
Document Type and Number:
WIPO Patent Application WO/2012/132550
Kind Code:
A1
Abstract:
An electrostatic lens (3), in which, as an ion incident optical system for sending ions into an orthogonal acceleration unit, five cylindrical electrodes (31-35) are arranged along an ion optical axis (C), and an aperture plate (38) is disposed on a common focal plane of two virtual convex lenses (L1, L2) formed under an afocal condition, is used. The diameter of an aperture opening (39) formed in the aperture plate (38) determines the angular spread of the exiting ion beam. When an applied voltage is set such that the electrostatic lens (3) becomes an afocal system, measurement with a high mass resolution can be performed though the sensitivity is sacrificed slightly, and when an applied voltage is set such that the electrostatic lens (3) becomes a non-afocal system in which an ion passing rate is maximized, measurement with a high sensitivity can be performed though the resolution is sacrificed slightly. Thus, in an orthogonal acceleration-type TOFMS, a mass-resolution priority mode and a measurement sensitivity priority mode can be switched readily.
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Inventors:
FURUHASHI OSAMU (JP)
TANIGUCHI JUNICHI (JP)
TANIGUCHI JUNICHI (JP)
Application Number:
PCT/JP2012/052593
Publication Date:
October 04, 2012
Filing Date:
February 06, 2012
Export Citation:
Assignee:
SHIMADZU CORP (JP)
FURUHASHI OSAMU (JP)
TANIGUCHI JUNICHI (JP)
FURUHASHI OSAMU (JP)
TANIGUCHI JUNICHI (JP)
International Classes:
H01J49/40; G01N27/62; H01J49/06
Foreign References:
| JP2001176444A | 2001-06-29 | |||
| JP2000340169A | 2000-12-08 | |||
| JP2008523554A | 2008-07-03 | |||
| JP2002083849A | 2002-03-22 | |||
| JP2003123685A | 2003-04-25 |
Other References:
D. W. O. HEDDLE ET AL.: "The zoom afocal lens", NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH A, vol. 298, no. 1-3, 1 December 1990 (1990-12-01), pages 291 - 294, XP055126989
Y. H. CHEN ET AL.: "Orthogonal electron impact ion source for a time-of-flight mass spectrometer with high mass resolving power", INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, vol. 185-187, 29 April 1999 (1999-04-29), pages 221 - 226, XP002670143
M. GUILHAUS ET AL.: "Orthogonal Acceleration Time-of-flight Mass Spectrometry", MASS SPECTROM: REV., vol. 19, 2000, pages 65 - 107
E. H. A. GRANNEMAN ET AL.: "Handbook on synchrotron radiation", vol. 1, article "TRANSPORT, DISPERSION AND DETECTION OF ELECTRONS, IONS AND NEUTRALS"
D W 0 HEDDLE: "An afocal electrostatic lens", JOURNAL OF PHYSICS E: SCIENTIFIC INSTRUMENTS, vol. 4, 1971, pages 981 - 983
Y. H. CHEN ET AL.: "Orthogonal electron impact ion source for a time-of-flight mass spectrometer with high mass resolving power", INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, vol. 185-187, 29 April 1999 (1999-04-29), pages 221 - 226, XP002670143
M. GUILHAUS ET AL.: "Orthogonal Acceleration Time-of-flight Mass Spectrometry", MASS SPECTROM: REV., vol. 19, 2000, pages 65 - 107
E. H. A. GRANNEMAN ET AL.: "Handbook on synchrotron radiation", vol. 1, article "TRANSPORT, DISPERSION AND DETECTION OF ELECTRONS, IONS AND NEUTRALS"
D W 0 HEDDLE: "An afocal electrostatic lens", JOURNAL OF PHYSICS E: SCIENTIFIC INSTRUMENTS, vol. 4, 1971, pages 981 - 983
Attorney, Agent or Firm:
Kyoto International Patent Law Office (JP)
Patent business corporation Kyoto international patent firm (JP)
Patent business corporation Kyoto international patent firm (JP)
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