Title:
WAVELENGTH MONITORING DEVICE
Document Type and Number:
WIPO Patent Application WO/2006/085650
Kind Code:
A1
Abstract:
Provided is a wavelength monitoring device, which is enabled to achieve prevention of upsizing and cost reduction by simplifying an optical system. The wavelength monitoring device comprises a collimate lens, a double refraction element, a Faraday rotor, a diffraction grating including a grid face having a plurality of grooves or ridges formed in parallel, and a linear image sensor. The crystal axis of the double refraction element and the diffraction grating are positioned such that the direction to form the grooves or ridges may be parallel to the separation direction of an abnormal ray in the double refraction element. Moreover, an optical signal coming a WDM device is collimated by the collimate lens and is separated into a normal ray and an abnormal ray by the double refraction element. Only the normal ray is passed through the Faraday rotator, and the polarization direction is turned by 90 degrees to arrange the normal ray and the abnormal ray in a polarization direction and to diffract the same on the grooves or ridges. At the same time, the spectral image of the two diffraction ray components diffracted is received on one light receiving portion of the linear image sensor thereby to output the intensity sum of optical signals.
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Inventors:
KONNO YOSHIHIRO (JP)
SASAKI MASARU (JP)
SASAKI MASARU (JP)
Application Number:
PCT/JP2006/302467
Publication Date:
August 17, 2006
Filing Date:
February 13, 2006
Export Citation:
Assignee:
NAMIKI PRECISION JEWEL CO LTD (JP)
KONNO YOSHIHIRO (JP)
SASAKI MASARU (JP)
KONNO YOSHIHIRO (JP)
SASAKI MASARU (JP)
International Classes:
G01J9/00; G01J3/18; H04B10/07
Domestic Patent References:
| WO2003058183A1 | 2003-07-17 |
Foreign References:
| JP2003083810A | 2003-03-19 | |||
| JP2003194627A | 2003-07-09 |
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