Title:
X-RAY PHASE DIFFERENCE IMAGING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2019/167324
Kind Code:
A1
Abstract:
An X-ray phase difference imaging system (100) is provided with: an X-ray source (1); a detector (5); a plurality of gratings; an image processing unit (11); and an object rotation mechanism (7) that causes an object (T) to rotate about the optical axis of X-rays, and thereby enables directing of a prescribed part of the object (T) toward a direction (Y direction) in which a grating among the gratings extends and toward a direction (X direction) which intersects the direction in which the grating among the gratings extends, in a plane orthogonal to the optical axis direction of the X-rays.
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Inventors:
HORIBA AKIRA (JP)
KIMURA KENJI (JP)
SHIRAI TARO (JP)
DOKI TAKAHIRO (JP)
SANO SATOSHI (JP)
MORIMOTO NAOKI (JP)
MIZUSHIMA HIROSHI (JP)
KIMURA KENJI (JP)
SHIRAI TARO (JP)
DOKI TAKAHIRO (JP)
SANO SATOSHI (JP)
MORIMOTO NAOKI (JP)
MIZUSHIMA HIROSHI (JP)
Application Number:
PCT/JP2018/036980
Publication Date:
September 06, 2019
Filing Date:
October 03, 2018
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N23/041
Domestic Patent References:
| WO2018186296A1 | 2018-10-11 | |||
| WO2018096759A1 | 2018-05-31 |
Foreign References:
| JP2014090967A | 2014-05-19 | |||
| JP2000193609A | 2000-07-14 | |||
| JP2013529984A | 2013-07-25 | |||
| JP2008545981A | 2008-12-18 | |||
| JP2015118074A | 2015-06-25 |
Attorney, Agent or Firm:
MIYAZONO, Hirokazu (JP)
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