Title:
DEVICE FOR PROVIDING TEST SIGNAL FROM TEST TARGET DEVICE (DUT) TO MEASUREMENT APPARATUS
Document Type and Number:
Japanese Patent JP2021099340
Kind Code:
A
Abstract:
To provide a probe head for measuring both an AC electric signal and a DC electric signal of high-power electronic signal from an inverter or from power electronics similar to an inverter.SOLUTION: There is disclosed a device for providing a test signal from a test target device (DUT) to a measurement apparatus. The device includes a probe head 110 formed to receive an electric signal from the DUT. The probe head 110 has an electrooptical modulator. The device also includes a control box 120 with a light source. The light source is formed so that the electrooptical modulator will be provided with an input light signal and the electrooptical modulator is formed to provide an output light signal on the basis of an electric signal from the DUT. A control box 120 also includes an optical bias control circuit. A bias control signal alone is provided to the electrooptical modulator.SELECTED DRAWING: Figure 1
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Inventors:
RYAN SCOTT
BOGDAN SZAFRANIEC
MIKE T MCTIGUE
HOWARD LANKFORD
BOGDAN SZAFRANIEC
MIKE T MCTIGUE
HOWARD LANKFORD
Application Number:
JP2020213585A
Publication Date:
July 01, 2021
Filing Date:
December 23, 2020
Export Citation:
Assignee:
KEYSIGHT TECHNOLOGIES INC
International Classes:
G01R31/302; G01R13/20; G01R13/28; G01R31/26; G02F1/035
Attorney, Agent or Firm:
Shoichi Okuyama
Matsushima Tetsuo
Ayako Nakamura
Satoshi Morimoto
Yu Tanaka
Tokumoto Koichi
Akiko Mizushima
Arihara Koichi
Matsushima Tetsuo
Ayako Nakamura
Satoshi Morimoto
Yu Tanaka
Tokumoto Koichi
Akiko Mizushima
Arihara Koichi