Title:
FIELD EMISSION TYPE ELECTRON GUN AND ITS STABILIZING METHOD
Document Type and Number:
Japanese Patent JP2964284
Kind Code:
B2
Abstract:
PURPOSE: To provide a method for stabilizing the emission current of a field emission type electron gun at ambient temperature in regard to a method for stabilizing the emission current of a field emission type electron gun used for an electron micro-scope, an electron beam exposure device, an electron beam inspection device and the like and a field emission type electron gun used for the execution of the aforesaid method.
CONSTITUTION: Reactive radical is generated by irradiating electromagnetic waves such as ultravilot rays, laser-beam and the like, irradiating corpuscular beam such as electron beam and the like, or irradiating electromagnetic waves such as ultrviolet rays, laser beam and the like with gas enclosed, onto the surface of the cathode 3 of a field emission type electron gun 2, and emission current is constituted to be stabilized by releasing atoms or molecules absorbed in the surface of the cathode 3.
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Inventors:
HONJO ICHIRO
Application Number:
JP27419991A
Publication Date:
October 18, 1999
Filing Date:
October 22, 1991
Export Citation:
Assignee:
FUJITSU KK
International Classes:
H01J9/02; H01J1/30; H01J1/304; H01J3/02; H01J5/16; H01J37/073; (IPC1-7): H01J1/30; H01J37/073
Domestic Patent References:
JP4332424A | ||||
JP51105761A | ||||
JP5062766A | ||||
JP6454639A | ||||
JP4711809A | ||||
JP422038A | ||||
JP534387B2 |
Attorney, Agent or Firm:
Seiichi Samukawa