Title:
イオン検出装置
Document Type and Number:
Japanese Patent JP7217189
Kind Code:
B2
Abstract:
The present invention implements an ion detector with which it is possible to avoid direct collisions of negative ions with a scintillator, prevent degradation of the scintillator, prolong life of the scintillator, reduce the need for maintenance, and perform highly sensitive detection of both positive and negative ions. With respect to a reference line 65 connecting a central point 63 of a positive ion CD 52 and a central point 64 of a counter electrode 54, a central point 66 of a negative ion CD 53 is provided in a region of a side opposite to a region of a side of a central point 67 of a scintillator 56. Positive ions entering from an ion entrance 62 receive a deflection force and collide with the positive ion CD 52 to generate secondary electrons. The generated secondary electrons collide with the scintillator 56 to generate light. The generated light passes through a light guide 59 and is detected by a photomultiplier tube 58. A negative potential barrier is generated along the reference line 65. Negative ions entering form the ion entrance 62 are attracted to and collide with the negative ion CD 53 to generate positive ions. The generated positive ions collide with the positive ion CD 52 to generate secondary electrons. The generated secondary electrons collide with the scintillator 56 and are detected by the photomultiplier tube 58.
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Inventors:
Yoshinari Kiyomi
Masuyuki Sugiyama
Yuichiro Hashimoto
Shin Imamura
Masuyuki Sugiyama
Yuichiro Hashimoto
Shin Imamura
Application Number:
JP2019062915A
Publication Date:
February 02, 2023
Filing Date:
March 28, 2019
Export Citation:
Assignee:
Hitachi High-Tech Co., Ltd.
International Classes:
H01J49/06; G01N27/62; H01J43/06
Domestic Patent References:
| JP10154483A | ||||
| JP1304649A | ||||
| JP2012049110A | ||||
| JP63276862A | ||||
| JP60143759A |
Foreign References:
| US20090294654 | ||||
| WO2008025135A1 |
Attorney, Agent or Firm:
Patent Attorney Corporation Kaichi
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