Title:
質量分析装置並びに該装置においてイオンの損失及び次段の真空負荷を低減するために用いられる方法
Document Type and Number:
Japanese Patent JP6540829
Kind Code:
B2
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Inventors:
Chang Xiao Tian
Jan gonyu
Hoang Yun Ching
Shen Jachi
Sun Wen Jiang
Jan gonyu
Hoang Yun Ching
Shen Jachi
Sun Wen Jiang
Application Number:
JP2017564525A
Publication Date:
July 10, 2019
Filing Date:
June 20, 2016
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
H01J49/06; G01N27/62
Domestic Patent References:
| JP2015507334A | ||||
| JP2009245933A | ||||
| JP2010157499A | ||||
| JP9180665A | ||||
| JP2012525672A | ||||
| JP200439400A |
Foreign References:
| WO2014203305A1 | ||||
| US20150034818 | ||||
| US7259371 |
Attorney, Agent or Firm:
Kyoto International Patent Office