Title:
MEASUREMENT DEVICE AND MEASUREMENT METHOD
Document Type and Number:
Japanese Patent JP2023106904
Kind Code:
A
Abstract:
To provide a measurement device capable of reducing an influence of disturbance light and improving measurement accuracy of an object.SOLUTION: A measurement device for optically measuring an object using a threshold comprises a light projecting section, a light receiving section that receives reflected light obtained by reflecting or scattering projection light by the object to generate a light reception signal, and a signal processing section for processing the light reception signal. A light receiving area including a plurality of light receiving elements in the light receiving section is divided into a plurality of measurement regions and is also divided into a plurality of peak position identification regions. Each of the plurality of peak position identification regions includes a part of each of two measurement regions adjacent to each other. The signal processing section determines a peak position identification region including a position of a light receiving element where an amount of received light in the light reception signal is maximum, estimates an amount of received light of a disturbance light component on the basis of a representative value of an amount of received light in each of the plurality of measurement regions located outside the two measurement regions of which a part of each is included in the determined peak position identification region, and controls a threshold on the basis of the amount of received light of the disturbance light component.SELECTED DRAWING: Figure 4
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Inventors:
ONO SHINJI
Application Number:
JP2022007905A
Publication Date:
August 02, 2023
Filing Date:
January 21, 2022
Export Citation:
Assignee:
PANASONIC IP MAN CORP
International Classes:
G01B11/00
Attorney, Agent or Firm:
Patent Attorney Corporation Eiko Office