To realize a predetermined surface roughness and no scratch and reduce a cost and working time by successively performing polishing processes from a rough polishing to a finish polishing in one process with one polishing device (surface plate), and realize selective polishing of only a desired region and a predetermined film thickness of an entire surface of a work regardless of initial film thickness variation of the work.
After an object 11 to be polished is polished to have the predetermined film thickness by a pad 1 for rough polishing arranged in an outer peripheral part on one surface plate A5, the object 11 is successively moved to a position of the pad 2 for finish polishing arranged at an inner peripheral part, thereby automatically changing a slurry and a polishing condition. Accordingly, polishing operations from the rough polishing to the finish polishing of the object can successively be performed in one process.
ISHIMARU HIDEYUKI
MURAKAMI TOMOYASU