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Title:
フルオロスルホンアミド基を含んだポリマーを含むポジ型フォトレジスト組成物およびその使用方法
Document Type and Number:
Japanese Patent JP4156599
Kind Code:
B2
Abstract:
A positive photoresist composition comprises a radiation sensitive acid generator, and a polymer that includes a first repeating unit derived from a sulfonamide monomer including a fluorosulfonamide functionality, a second repeating unit having a pendant acid-labile moiety, and a third repeating unit having a lactone functionality. The positive photoresist composition may be used to form patterned features on a substrate, such as those used in the manufacture of a semiconductor device.

Inventors:
Wenchie Li
Pushkar Lao Varanas
Application Number:
JP2005000960A
Publication Date:
September 24, 2008
Filing Date:
January 05, 2005
Export Citation:
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Assignee:
INTERNATIONAL BUSINESS MASCHINES CORPORATION
International Classes:
G03F7/039; C08F220/18; C08F220/28; C08F220/38; C08F232/04; G03C1/76; G03F7/004; G03F7/20; H01L21/027
Domestic Patent References:
JP2003241381A
Attorney, Agent or Firm:
Hiroshi Sakaguchi
Yoshihiro City
Takeshi Ueno