Title:
TESTING DEVICE
Document Type and Number:
Japanese Patent JP2022108850
Kind Code:
A
Abstract:
To provide a testing device that can detect a testing force with higher accuracy.SOLUTION: A testing device performs a test for detecting the amount of displacement occurring when a testing force is applied to a test piece, and the testing device comprises: an indenter that is provided on a cross head moved by a load mechanism and applies a testing force to one face of the test piece; a load detector that is provided on the cross head to detect the testing force applied to the test piece; a probe that is arranged at a position opposite to the indenter with the test piece therebetween; a displacement detector that detects, from the amount of movement of the probe, the amount of displacement of the test piece occurring when the testing force is applied; and an urging member that connects the probe and the indenter to each other, and urges the probe to be in contact with the indenter with the test piece therebetween.SELECTED DRAWING: Figure 1
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Inventors:
MATSUSHITA KAZUHIRO
FUSE HISANORI
FUSE HISANORI
Application Number:
JP2021004027A
Publication Date:
July 27, 2022
Filing Date:
January 14, 2021
Export Citation:
Assignee:
SHIMADZU CORP
International Classes:
G01N3/20
Domestic Patent References:
| JP2015031652A | 2015-02-16 | |||
| JP2016020879A | 2016-02-04 |
Attorney, Agent or Firm:
Patent Business Corporation Kushibuchi International Patent Office
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