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Title:
SECONDARY IONIZED MASS SPECTROMETER
Document Type and Number:
Japanese Patent JPS6044
Kind Code:
A
Abstract:

PURPOSE: To enable the measurement of a sample dissolved in a solvent using the SIMS method by spraying the sample, jetting it from a narrow hole, forming it into a molecular-line type sample, introducing it into a high vacuum chamber that is set to the degree of specific vacuum through the narrow hole section such as a skimmer that is exhausted differentially, and making it collide against a metal plate.

CONSTITUTION: A sample solution dissolved in a solvent that is sequentially separated by a liquid chromatograph device 1 is jetted as a molecular-line type sample 3 through an atomizer 2 with a nozzle of 10μm in diameter, for example. The sample solution is sprayed to this atomizer 2 from the nozzle using an ultrasonic vibrator. The molecular-line type sample 3 starting from the atomizer 2 is introduced into an ionized chamber 5 that is kept in high vacuum of 10-5 to 10-6 Torr through a single or a number of heated skimmers 4 and collides against a metal target 6 made of silver plate and such provided in the ionized chamber. The sample adhesion surface section of the target 6 is irradiated with a primary ion beam 7 with an inclination of 20 degrees against the surface of the target 6.


Inventors:
SAKAIRI MINORU
KANBARA HIDEKI
Application Number:
JP10679783A
Publication Date:
January 05, 1985
Filing Date:
June 16, 1983
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
G01N23/225; G01N27/62; H01J37/252; H01J49/02; H01J49/10; H01J49/14; (IPC1-7): H01J37/252; G01N23/225
Attorney, Agent or Firm:
Junnosuke Nakamura