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Title:
ANALYTICAL THRESHOLD DETERMINATION DEVICE AND ANALYTICAL THRESHOLD DETERMINATION METHOD
Document Type and Number:
WIPO Patent Application WO/2019/235209
Kind Code:
A1
Abstract:
An analytical threshold determination device (100) that comprises a threshold determination unit (46) that, on the basis of pairs of thresholds that have been generated by a computation unit (41) and of count values that have been outputted by a pulse counting unit (34), determines a pair or a plurality of pairs of thresholds that is/are to be used for analysis. Each time the pulse counting unit (34) counts a pulse, until reaching a prescribed value, the computation unit (41) iteratively generates a new pair of thresholds in which at least one of the pair of thresholds has been changed. On the basis of a frequency distribution in which the generated pairs of thresholds are the bins and the count values outputted by the pulse counting unit (34) are the frequencies, the threshold determination unit (46) selects a bin that is a representative value. The threshold determination unit (46) determines a pair or a plurality of pairs of thresholds that correspond(s) to the bins that are within a prescribed range of the bin that is the representative value.

Inventors:
SAITO ATSUSHI (JP)
IWAMA SHIGEHIKO (JP)
YAMAMOTO MASAHIRO (JP)
Application Number:
PCT/JP2019/020063
Publication Date:
December 12, 2019
Filing Date:
May 21, 2019
Export Citation:
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Assignee:
JVC KENWOOD CORP (JP)
International Classes:
G01N21/41; G01N33/543
Foreign References:
JP2016070782A2016-05-09
JPH0862274A1996-03-08
JP2010109195A2010-05-13
JP2015194405A2015-11-05
JP2015194403A2015-11-05
EP2871762A12015-05-13
Attorney, Agent or Firm:
MIYOSHI Hidekazu et al. (JP)
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