Title:
APPARATUS FOR CONTROLLING TEMPERATURE OF SAMPLE WHEN PERFORMING PHOTOELECTRONIC MEASUREMENT AND SOLAR CELL MEASURING APPARATUS USING SAME
Document Type and Number:
WIPO Patent Application WO/2016/017846
Kind Code:
A1
Abstract:
Disclosed is an apparatus for controlling the temperature of a sample when performing a photoelectronic measurement of the sample. The apparatus for controlling the temperature of a sample when performing a photoelectronic measurement of the sample, according to the present invention, comprises: a sample stage to which a sample subject to measurement is fixed; a cooling unit for cooling the sample by jetting air; and a temperature measuring unit which has a thermometer for measuring the temperature of the sample. The present invention has an effect of easily adjusting the temperature of the sample subject to measurement by applying a direct sample temperature control means in which the air is directly jetted onto the sample or the air is cooled and then jetted onto the sample.
Inventors:
AHN SEOUNGKYU (KR)
YOON KYUNG HOON (KR)
YUN JAE HO (KR)
CHO JUN SIK (KR)
AHN SEJIN (KR)
GWAK JIHYE (KR)
SHIN KEE SHIK (KR)
KIM KIHWAN (KR)
PARK JOO HYUNG (KR)
EO YOUNG JOO (KR)
YOO JIN SU (KR)
CHO ARA (KR)
YOON KYUNG HOON (KR)
YUN JAE HO (KR)
CHO JUN SIK (KR)
AHN SEJIN (KR)
GWAK JIHYE (KR)
SHIN KEE SHIK (KR)
KIM KIHWAN (KR)
PARK JOO HYUNG (KR)
EO YOUNG JOO (KR)
YOO JIN SU (KR)
CHO ARA (KR)
Application Number:
PCT/KR2014/007369
Publication Date:
February 04, 2016
Filing Date:
August 08, 2014
Export Citation:
Assignee:
KOREA ENERGY RESEARCH INST (KR)
International Classes:
H02S50/00; G05D23/19; H02S40/42
Foreign References:
| KR101281053B1 | 2013-07-09 | |||
| KR101292789B1 | 2013-08-05 | |||
| KR20110023966A | 2011-03-09 | |||
| KR20120096832A | 2012-08-31 |
Attorney, Agent or Firm:
DAWOOL PATENT AND LAW FIRM (KR)
특허법인다울 (KR)
특허법인다울 (KR)
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