Title:
AUTOMATIC ANALYZER AND OPTICAL MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2020/039997
Kind Code:
A1
Abstract:
Provided are an automatic analyzer and an optical measurement method for correcting a variation in the multiplication factor of a photoelectric element with high accuracy. The automatic analyzer comprises: a photoelectric element which generates electrons by light and outputs a current signal; a voltage application unit which applies a voltage to the photoelectric element; and a processing unit which corrects a variation in the multiplication factor of the photoelectric element, wherein the photoelectric element outputs a pulse signal as the current signal, and the processing unit corrects the variation in the multiplication factor on the basis of the pulse area of the pulse signal.
Inventors:
SUZUKI KOSUKE (JP)
ONISHI FUJIO (JP)
TANOUE HIDETSUGU (JP)
ONISHI FUJIO (JP)
TANOUE HIDETSUGU (JP)
Application Number:
PCT/JP2019/031829
Publication Date:
February 27, 2020
Filing Date:
August 13, 2019
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01J1/42; G01N35/00
Domestic Patent References:
| WO2014133160A1 | 2014-09-04 |
Foreign References:
| US20110186740A1 | 2011-08-04 | |||
| JP2016026301A | 2016-02-12 | |||
| JP2015037421A | 2015-02-26 | |||
| JP2016102799A | 2016-06-02 | |||
| JP2009500608A | 2009-01-08 | |||
| JP2016506504A | 2016-03-03 | |||
| JP2012037267A | 2012-02-23 | |||
| JP2014222165A | 2014-11-27 | |||
| JP2017151052A | 2017-08-31 |
Other References:
See also references of EP 3842771A4
Attorney, Agent or Firm:
HIRAKI & ASSOCIATES (JP)
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