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Title:
ELECTRONIC DEVICE FOR DETERMINING FAILURE OF SIGNAL PATH AND COMPONENT, AND METHOD FOR OPERATING SAME
Document Type and Number:
WIPO Patent Application WO/2019/143100
Kind Code:
A1
Abstract:
Provided are an electronic device for determining failure of a signal path and a component, and a method for operating the electronic device according to various embodiments. The electronic device comprises: at least one connection part for connection to an external device; a first signal path including an amplifier for amplifying a signal transmitted to the outside of the electronic device; a second signal path for obtaining another signal from the outside of the electronic device; an antenna port electrically connected to the first signal path and the second signal path through a filter circuit; and a communication module, wherein the communication module may be configured to transmit a transmission signal through the first signal path to the antenna port, obtain at least a part of the transmission signal through the second signal path, and determine whether the electronic device is defective on the basis of the transmission signal and information associated with at least a part of the transmission signal.Various other embodiments are possible.

Inventors:
SON YOONKOOK (KR)
AN YONGJUN (KR)
LEE YUSEON (KR)
LEE HANYEOP (KR)
KIM JOOSUNG (KR)
NA HYOSEOK (KR)
KU DOIL (KR)
KANG HYUNSANG (KR)
VAN JUHO (KR)
PYO CHULSEUNG (KR)
Application Number:
PCT/KR2019/000590
Publication Date:
July 25, 2019
Filing Date:
January 15, 2019
Export Citation:
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Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
H04B17/17; H04B17/14; H04B17/29
Foreign References:
KR20000007967A2000-02-07
KR20090122972A2009-12-01
KR20060096683A2006-09-13
KR20030008625A2003-01-29
KR100758309B12007-09-12
Attorney, Agent or Firm:
YOON & LEE INTERNATIONAL PATENT & LAW FIRM (KR)
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