Title:
FINE PARTICLE MEASUREMENT DEVICE AND FINE PARTICLE MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2023/008580
Kind Code:
A1
Abstract:
[Problem] To provide a fine particle measurement device and method that enable scattered light from fine particles to be measured easily and with high sensitivity, by using a light diffraction effect. [Solution] A fine particle measurement device 100 comprises: an illumination device 101 that illuminates a flow path 12; and a detection device 102 that detects light from the flow path 12. The detection device 102 is used to measure interference between scattered light L1 from particles passing through the flow path 12 and diffracted light L2 from the flow path 12, and information relating to the particles passing through the flow path 12 is thereby acquired.
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Inventors:
MAWATARI KAZUMA (JP)
TSUYAMA YOSHIYUKI (JP)
TSUYAMA YOSHIYUKI (JP)
Application Number:
PCT/JP2022/029394
Publication Date:
February 02, 2023
Filing Date:
July 29, 2022
Export Citation:
Assignee:
UNIV TOKYO (JP)
International Classes:
G01N15/14; G01N21/47; G01N21/53; G01N37/00
Domestic Patent References:
| WO1990005310A2 | 1990-05-17 |
Foreign References:
| JP2020204594A | 2020-12-24 | |||
| US20090290156A1 | 2009-11-26 |
Attorney, Agent or Firm:
FUKUDA, Mitsuhiro et al. (JP)
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